太阳成集团tyc33455cc官网

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SICC was founded in 2010. It is a technologicalcompany focusing on the R&D, production and sales of silicon carbide (SiC)substrate material.

With the business philosophy of Technology ·Quality · Sustainability, SICC attaches importance to product and servicequality, takes meeting customer needs and helping customers solve problems asits work orientation. SICC actively expands the market and pursues sustainablebusiness development while mastering the process technology independently.

The SiC Single Crystal Substrate is a widebandgap semiconductor material. Compared with traditional materials, it hasbetter physical properties and can effectively improve the power density andoverall performance of devices. It can be widely used in fields of powerelectronics and microwave electronics.

But what behind the superior physicalproperties are sophisticated and complex preparation processes. The SiC signalcrystal grows in an enclosed environment with high temperature and low pressure.Any slight change in the environment may cause lattice disorder, which willaffect the crystal quality.

Relying on the experience of industrialization andthe R&D team, SICC keeps paying attention to technology leading and qualityimproving, and insists on continuous innovation. SICC will build integratedsolutions to improve service and product, and strives to become aninternational famous company of semiconductor materials.

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Product consultation

Contact: Sales Department
Tel: 0531-85978212
Fax: 0531-85978212
Email: sales@sicc.cc
Address: No. 99, Tianyue South Road, Huaiyin District, Jinan City, Shandong Province

Investor Relations

Contact: Office of the Board of Directors
Tel: 0531-69900616
Fax: 0531-85978212
Email: dmo@sicc.cc
Address: No. 99, Tianyue South Road, Huaiyin District, Jinan City, Shandong Province

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N-type SiC substrate materials are primarily used for homoepitaxial growth in the fabrication of power semiconductor devices.
They are widely applied in new energy sectors such as electric vehicles, as well as in photovoltaic and wind power generation.
Currently, SICC\'s 6-inch and 8-inch products are consistently delivered to global customers for volume production, while also
possessing the capability to produce 12-inchsubstrate products.

*Please contact our sales for more detailed information.

>Contact us

Specifications

6-inch
  • Diameter 150.0mm+0mm/-0.2mm
  • Surface Orientation 4°toward<1120>±0.5°
  • Primary Flat Length 47.5 mm ±1.5 mm
  • Primary Flat Orientation <1120>±1.0°
  • Notch Orientation /
  • Notch Angle /
  • Notch Depth /
  • Secondary Flat N/A
  • Thickness 350.0um士25.0um
  • Polytype 4H
  • Type n-type

*Please contact our sales for more detailed information.

>Contact us

Specifications

8-inch
  • Diameter 200.0mm+0mm/-0.5mm
  • Surface Orientation 4°toward<1120>±0.5°
  • Primary Flat Length Notch
  • Primary Flat Orientation /
  • Notch Orientation <1100>±1.0°
  • Notch Angle 90°+5°/-1°
  • Notch Depth 1.0mm+0.25mm/-0mm
  • Secondary Flat N/A
  • Thickness 500.0um士25.0um
  • Polytype 4H
  • Type n-type

*Please contact our sales for more detailed information.

>Contact us

Specifications

12-inch
  • Diameter 300.0mm+0mm/-0.5mm
  • Surface Orientation 4°toward<1120>±0.5°
  • Primary Flat Length Notch
  • Primary Flat Orientation /
  • Notch Orientation <1100>±5.0°
  • Notch Angle 90°+5°/-1°
  • Notch Depth 1.0mm+0.25mm/-0mm
  • Secondary Flat N/A
  • Thickness 750.0um士25.0um
  • Polytype 4H
  • Type n-type

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What is Silicon Carbide

Compared with traditional materials, silicon carbide has excellent physical properties,
which can reduce weight and improve efficiency for discrete devices, modules and even systems

SiC

Si(silicon)+C(carbon)=SiC
Silicon carbide is a group IV - IV compound semiconductor material formed by C and Si elements in the ratio of 1:1,
and its hardness is second only to diamond.
This semiconductor material has great development potential, but is hard and brittle.
The preparation process is complex and the processing is difficult.

SiC Features

Excellent physical properties
Wide bandgap (High temperature resistance)1
High critical breakdown field(High voltage resistance2
High thermal conductivity(Heat dissipation)3
Saturated electron drift velocity(High switching speed)4
4H-SiC Si GaAs GaN
Wide bandgap(eV)1 3.26 1.12 1.42 3.42
High critical breakdown field(MV/cm)2 2.8 0.3 0.4 3
High thermal conductivity(W/cmK)3 4.9 1.5 0.46 1.3
Saturated electron drift velocity(1E7 cm/s)4 2.7 1 2 2.7
1.A wider bandgap can ensure that electrons are not easy to transit and intrinsic excitation is weak at high temperature. Thus, it can withstand higher operating temperature.
The bandgap width of silicon carbide is three times that of silicon, and its theoretical working temperature can reach more than 400 ℃.

2.Critical breakdown field strength refers to the electric field strength in electric breakdown. Once this value is exceeded, the material will lose its insulation performance.
It determines the voltage resistance of a material.
The critical field strength of silicon carbide is about 10 times that of Si, which can withstand higher voltage and is more suitable for high voltage devices.

3.Heat is one of the main reasons affecting the lifetime of devices.
The thermal conductivity represents the material\'s ability to conduct heat.
The high thermal conductivity of silicon carbide can effectively conduct heat, reduce the device temperature and maintain its normal operation. 

4.The saturated electron drift velocity refers to the maximum directional moving speed of electrons in semiconductor materials.
It determines the switching frequency of devices.
The saturated electron drift velocity of silicon carbide is twice that of silicon, which can miniaturize the device and improve efficiency.

SiC Applications

Power Electronics Devices

SiC power devices have unique advantages such as high voltage, high current, high temperature, high frequency and low loss, which will greatly improve the energy conversion efficiency of existing silicon based power devices and have a significant and far-reaching impact on the field of efficient energy conversion.
The main application fields are electric vehicles, charging piles, photovoltaic new energy, rail transit, smart grid, etc.

Microwave Communication

Silicon carbide based gallium nitride RF devices have been successfully applied in many fields, mainly in wireless communication infrastructure.
Silicon carbide as substrate gallium nitride RF devices have both good thermal conductivity of silicon carbide and advantages of high-power RF output of gallium nitride in high frequency band, which can provide the power and efficiency required by the next generation of high frequency telecommunication network and become the mainstream choice of 5G base station power amplifier.
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Directors, Supervisors and Senior Management
董事
  • 宗艳民先生

    宗艳民先生,61岁,本科学历,为本公司的董事长、执行董事兼总经理,于2010年11月2日获委任为董事,并于2025年2月19日获调整董事角色为执行董事。
    宗先生在半导体材料的技术研发与产业化、工程以及企业管理领域拥有逾35年经验。2010年11月,宗先生创立了本公司前身山东太阳成集团tyc33455cc官网材料科技有限公司,并于2010年11月至2020年11月期间历任董事会主席、执行董事及总经理。自2020年11月起,宗先生一直担任本公司董事长、董事兼总经理。
  • 高超先生

    高超先生,38岁,博士学历,为本公司执行董事兼首席技术官。彼于2019年8月15日获委任为董事,并于2025年2月19日获调整董事角色为执行董事。
    高先生于半导体材料技术研发及产业化领域拥有逾十年经验。于2014年7月至2020年11月期间,彼先后在本公司前身山东太阳成集团tyc33455cc官网材料科技有限公司担任研发工程师、研发中心主任、董事兼研发中心主任。自2020年11月起,高先生一直担任本公司的董事兼首席技术官。
  • 王俊国先生

    王俊国先生,47岁,于2025年7月2日获委任为董事,并于同日获调整董事角色为执行董事。
    王先生在财务管理领域拥有丰富经验。彼于2016年8月至2020年11月期间担任本公司前身山东太阳成集团tyc33455cc官网材料科技有限公司财务总监,并自2020年11月起担任本公司财务总监,并自2024年8月起担任我们的证券事务代表。
  • 邱宇峰先生

    邱宇峰先生,65岁,硕士学历,于2024年2月29日获委任为董事,并于2025年2月19日获调整董事角色为非执行董事。邱先生于2020年11月至2021年1月期间担任本公司独立董事。
    邱先生在电力及半导体技术研发领域拥有逾30年经验。于1994年6月至1999年11月期间,彼先后在中国电力科学研究院电力系统研究所担任继电保护室主任及副所长;于1999年11月至2006年12月期间,彼在中国电力科学研究院输配电及节电 技术国家工程研究中心担任常务副主任;于2006年12月至2012年2月期间,彼在中国电力科学研究院担任副院长。邱先生于2012年2月至2020年2月期间,先后在全球能源互联网研究院有限公司(前称国网智能电网研究院)担任多个职位,包括副院长、院长、顾问及其他职位。邱先生现任厦门大学讲座教授,以及自2022年4月起担任博测锐创半导体科技(苏州)有限公司董事会主席兼总经理,自2022年5月起担任北京博测半导体科技有限公司执行董事兼总经理,自2023年6月起担任思源电气股份有限公司(一家于深圳证券交易所上市的公司(股票代码:002028))的独立董事,并自2023年9月起担任北京顺德盛企业管理合伙企业(有限合伙)的执行事务合伙人。
  • 李婉越女士

    李婉越女士,54岁,硕士学历,于2025年2月19日获委任为董事,并于同日获调整董事角色为非执行董事。
    李女士在会计及融资领域拥有30年经验。彼于1994年7月至1999年7月期间任职于北京新型建筑材料总厂,离职前为助理会计师。 于1999年10月至2020年12月期间,李女士先后在北新建材(集团)有限公司担任多个职位,包括财务部会计、财务部经理及其他职位。自2022年12月起,彼一直担任中建材联合投资有限公司的总会计师。
  • 方伟先生

    方伟先生,50岁,硕士学历,于2024年2月29日获委任为董事,并于2025年2月19日获重新委任为非执行董事。
    方先生在无线产品工程及企业管理领域拥有逾25年经验。自1999年2月起,彼任职于一家从事ICT(信息与通信)基础设施和智能终端提供商业务的全球性企业,现任第五轨道外派董事。自2023年12月起,彼亦担任苏州东微半导体股份有限公司(一家于上海证券交易所上市的公司(股票代码:688261))董事。
  • 李洪辉先生

    李洪辉先生,61岁,博士学历,于2024年2月29日获委任为独立董事,并于2025年2月19日获调整董事角色为独立非执行董事。
    李先生在财务管理领域拥有丰富的经验。彼任职于中华人民共和国财政部至2014年8月,最后职位为投资评审中心副主任。彼亦于2014年8月至2018年7月期间担任中国信达资产管理股份有限公司(一家于香港联交所上市的公司(股份代号:1359))董事。李先生于2018年担任中华人民共和国财政部预算评审中心副主任。彼亦担任中海外科技开发有限公司董事长至2019年11月。自2022年6月起至2024年1月期间,彼担任北京中财宝信管理咨询有限公司执行董事。李先生自2023年6月起,担任中润辉铭(海南)投资有限公司执行董事、总经理兼财务总监;自2023年10月起, 担任华大卓越(北京)投资管理有限公司(前称北京百家信诚投资管理有限公司)执行董事、总经理兼财务总监;自2024年8月起,担任吉林省北药科技有限公司总经理;并自2024年10月起,担任辽宁北药金吉科技发展有限公司监事。
  • 刘华女士

    刘华女士,56岁,本科学历,于2024年2月29日获委任为独立董事,并于2025年2月19日获调整董事角色为独立非执行董事。 刘女士在法律、监管及合规治理领域拥有丰富经验。彼于1992年7月至2002年3月期间在山东三联集团有限责任公司任职。于2002年7月至2007年2月及2007年2月至2008年7月,刘女士分别担任山东康桥律师事务所及北京天驰君泰律师事务所律师。于2008年8月至2019年10月期间,彼担任山东森信律师事务所合伙人及律师。自2019年11月起,刘女士担任北京天驰君泰(济南)律师事务所合伙人及律师。
  • 黎国鸿先生

    黎国鸿先生,61岁,硕士学历,于2025年2月19日获委任为独立董事,并于同日获调整董事角色为独立非执行董事。 黎先生在企业管治以及财务咨询及管理领域拥有丰富经验。彼于1989年7月至1996年8月期间前后在德勤·关黄陈方会计师行担任会计专员、高级会计师及经理。于1997年4月至2006年12月期间,黎先生就职于冠亚商业集团有限公司(一家于香港联交所上市的公司(股份代号:0104)),彼担任的最后职务为公司秘书兼财务总监。于2007年1月至2013年4月期间,黎先生在德祥地产集团有限公司(一家于香港联交所上市的公司(股份代号:0199))担任财务总监及在德祥企业集团有限公司(一家于香港联交所上市的公司(股份代号:0372))担任首席财务官兼公司秘书。自2013年8月起,黎先生在盛洋投资(控股)有限公司(一家于香港联交所上市的公司(股份代号:0174)) 担任执行董事及董事会投资委员会成员,并自2020年12月起兼任首席执行官。自2017年2月起,彼在桦欣控股有限公司(一家于香港联交所上市的公司(股份代号:1657))担任独立非执行董事。
监事
  • 张红岩女士

    张红岩女士,38岁,硕士学历,于2020年11月7日获委任为监事兼监事会主席。 张女士在技术工程领域拥有丰富经验。彼先后于2012年4月至2020年11月期间担任本公司前身山东太阳成集团tyc33455cc官网材料科技有限公司质量部技术员、技术中心主管、销售技术支持及质量部经理。自2020年11月起,彼担任本公司质量部负责人及监事。
  • 宋建先生

    宋建先生,38岁,于2020年11月7日获委任为监事。 宋先生在碳化硅研发领域拥有丰富经验。彼先后于2011年8月至2020年11月期间担任本公司前身山东太阳成集团tyc33455cc官网材料科技有限公司碳化硅事业部技术员及负责人、技术中心主管及设备动力部经理。自2020年11月起,彼担任本公司工程部负责人及监事。
  • 窦文涛先生

    窦文涛先生,42岁,于2024年8月22日获委任为监事。 窦先生在项目管理及企业管治领域拥有丰富经验。窦先生先后于2010年10月至2020年11月期间担任本公司前身山东太阳成集团tyc33455cc官网材料科技有限公司项目经理、销售部经理、执行董事(代)及董事长助理。自2020年11月起,彼担任本公司董事长助理。
高级管理人员
  • 宗艳民先生

    宗艳民先生,61岁,本科学历,为本公司的董事长、执行董事兼总经理,于2010年11月2日获委任为董事,并于2025年2月19日获调整董事角色为执行董事。 宗先生在半导体材料的技术研发与产业化、工程以及企业管理领域拥有逾35年经验。2010年11月,宗先生创立了本公司前身山东太阳成集团tyc33455cc官网材料科技有限公司,并于2010年11月至2020年11月期间历任董事会主席、执行董事及总经理。自2020年11月起,宗先生一直担任本公司董事长、董事兼总经理。
  • 高超先生

    高超先生,38岁,博士学历,为本公司执行董事兼首席技术官。彼于2019年8月15日获委任为董事,并于2025年2月19日获调整董事角色为执行董事。 高先生于半导体材料技术研发及产业化领域拥有逾十年经验。于2014年7月至2020年11月期间,彼先后在本公司前身山东太阳成集团tyc33455cc官网材料科技有限公司担任研发工程师、研发中心主任、董事兼研发中心主任。自2020年11月起,高先生一直担任本公司的董事兼首席技术官。
  • 钟文庆先生

    钟文庆先生,57岁,自2022年8月起担任本公司董事会秘书。钟先生于2018年12月加入本集团,并先后于2018年12月至2019年8月期间担任本公司首席财务官,于2019年8月至2023年4月期间担任董事兼首席财务官,并于2023年4月至2024年2月期间担任董事。钟先生目前还在本公司的若干子公司中担任董事及╱或监事职务。 钟先生在会计与财务管理、资本市场及企业管治领域拥有逾25年经验。在加入本集团之前,彼于1998年1月至1999年2月期间在通用磨坊(中国)投资有限公司的品食乐大中华区担任财务经理。在美国施乐中国有限公司工作期间,钟先生担任财务总监及市场总监。其后彼于2003年12月至2005年4月在西门子工业软件(上海)有限公司担任财务分析高级经理。钟先生于2005年6月加入沃尔沃建筑设备(中国)有限公司并担任沃尔沃建筑设备公司中国区首席财务官。钟先生于2011年1月至2018年11月期间担任瑞迈国际有限公司总裁。
  • 游樱女士

    游樱女士,50岁,自2024年9月起担任本公司首席财务官。游女士自2024年4月加入本集团起一直担任上海太阳成集团tyc33455cc的财务总监。 游女士在会计与财务管理领域拥有逾25年经验。在加入本集团之前,彼于1998年7月至2004年12月期间在山东干聚有限责任会计师事务所担任审计经理。游女士于2004年12月至2024年3月期间在上汽通用东岳汽车有限公司担任高级财务经理。
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Our mission

To achieve greater profits for shareholders
To provide better products and services for customers
To offer better development platform and benefits for employees
To create greater value and wealth for the society

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Product Consultation

You can contact us through the following ways, or put forward your requirements online

Contact:Sales Department

Tel:0531-85978212
Fax:0531-85978212
E-mail:sales@sicc.cc
Address:No.99 South Tianyue Road, Huaiyin District, Jinan, Shandong.
Online input

Investors

Contact:Board of Directors Office
Tel:0531-69900616
Fax:0531-85978212
E-mail:dmo@sicc.cc
Address:No.99 South Tianyue Road, Huaiyin District, Jinan, Shandong.
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The Semi-insulating SiC substrates have high resistivity and are mainly used for GaN heteroepitaxy.
The RF devices represented by HEMT combine the excellent thermal conductivity of SiC with the high-power Rf output of
GaN in high-frequency range, and are widely applied in the new generation communication field such as the 5G stations.
Semi-insulating Sic substrate materials also exhibit excellent optical properties.
The 12-inch substrates show promising application prospects in optical and wearable electronics, such as AR glasses.

*Please contact our sales for more detailed information.

>Contact us

Specifications

6-inch
  • Diameter 150.0mm+0mm/-0.2mm
  • Surface Orientation {0001}±0.2°
  • Primary Flat Orientation /
  • Secondary Flat Orientation /
  • Primary Flat Length Notch
  • Secondary Flat Length None
  • Notch Orientation <1100>±1.0°
  • Notch Depth None1mm+0.25mm/-0mm from edge
  • Notch Angle 90°+5°/-1°
  • Thickness 500.0um±25.0um
  • Type Semi-insulating

*Please contact our sales for more detailed information.

>Contact us

Specifications

8-inch
  • Diameter 200.0mm+0mm/-0.5mm
  • Surface Orientation {0001}±0.2°
  • Primary Flat Orientation /
  • Secondary Flat Orientation /
  • Primary Flat Length Notch
  • Secondary Flat Length None
  • Notch Orientation <1100>±1.0°
  • Notch Depth None1mm+0.25mm/-0mm from edge
  • Notch Angle 90°+5°/-1°
  • Thickness 500.0um±25.0um
  • Type Semi-insulating

*Please contact our sales for more detailed information.

>Contact us

Specifications

12-inch
  • Diameter 300.0mm+0mm/-0.5mm
  • Surface Orientation {0001}±0.5°
  • Primary Flat Orientation /
  • Secondary Flat Orientation /
  • Primary Flat Length Notch
  • Secondary Flat Length None
  • Notch Orientation <1100>±5.0°
  • Notch Depth None1mm+0.25mm/-0mm from edge
  • Notch Angle 90°+5°/-1°
  • Thickness 750.0um±25.0um
  • Type Semi-insulating

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Production Process of SiC Single Crystal

Silicon carbide single crystal is extremely rare in nature and can only be prepared by artificial synthesis. At present, the industrial production of silicon carbide substrate is mainly based on PVT method. This method needs to sublimate the powder with high temperature and vacuum, and then let the components grow on the seed surface through thermal field control, so as to obtain the silicon carbide crystals. The whole process is completed in an enclosed space, with few effective monitoring and many variables, which requires high process control accuracy.

SICC independently own the whole process from SiC powder to crystal growth and wafering.
1.

SiC Powder

Si+C=SiCPowder
Si and C are synthesized to SiC polycrystalline particles in the ratio of 1:1
SiC powder is the source of crystal growth, and its particle size and purity will directly affect the crystal quality
Especially in the preparation of semi-insulating substrate, the requirement of powder purity is very high
(Impurity content<0.5ppm)
2.

Seed

As the base of crystal growth, it provides the basic lattice structure for crystal growth
It is also the core raw material for crystal quality
3.

Crystal Growth

Physical Vapor Transport(PVT)
The raw materials are heated,
and the sublimated components recrystallize on the seed surface through vapor sublimation and thermal field control
4.

Slicing

SiC is a hard and brittle material whose hardness is second only to diamond
Therefore, it takes long time for slicing, and is easy to crack.
5.

Lapping•Polishing

MP·CMP
Lapping and polishing is to process the substrate surface to nano smooth mirror, which is Epi-ready
The surface state of substrate, such as surface roughness and thickness uniformity, will directly affect the quality of epitaxy and then affect the quality of devices.
6.

Cleaning • Inspection

To remove residual particles and metal impurities in the wafering processes
The final inspection can retain complete quality information such as substrate surface, surface flatness and crystal quality
It helps to trace for the downstream process
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Approaching SiC | The Principle of Silicon Carbide Crystal Growth

    In nature, crystals are everywhere, and their distribution and application are very extensive. Salt, sugar, diamond and snowflakes are all crystals that can be seen in daily life; Besides, crystal materials such as semiconductor crystal, laser crystal, scintillation crystal, and super-hard crystal also play an important role in industry, medical treatment, semiconductor, and many scientific research fields.

    Different crystals have different structures, properties and preparation methods. But their common feature is that the atoms in the crystal are regularly arranged, and the lattice with a specific structure is then formed through periodic stacking in three-dimensional space. Therefore, the appearance of crystal materials usually presents a regular geometric shape.

    Silicon Carbide Single Crystal Substrate Material (hereinafter referred to as SiC Substrate) is also a kind of crystalline materials. It belongs to wide bandgap semiconductor material, and has the advantages of high voltage resistance, high temperature resistance, high frequency, low loss, etc. It is a basic material for preparing high-power electronic devices and microwave RF devices.

The Crystal Structure of SiC

    SiC is a IV-IV compound semiconductor material composed of Carbon and Silicon in a stoichiometric ratio of 1:1, and its hardness is second only to diamond.

    Both Carbon and Silicon atoms have 4 valence electrons, which can form 4 covalent bonds. The basic structural unit of SiC crystal, SiC tetrahedron, arises out of the tetrahedral bonding between Silicon and Carbon atoms. The coordination number of both Silicon and Carbon atoms is 4, i.e. each Carbon atom has 4 Silicon atoms around it and each Silicon atom also has 4 Carbon atoms around it.

    As a crystal material, SiC Substrate also has the characteristic of periodic stacking of atomic layers. The Si-C diatomic layers are stacked along [0001] direction.Due to the small difference in bond energy between layers, different connection modes are easily generated between atomic layers, leading to over 200 SiC polytypes. Common polytypes include 2H-SiC, 3C-SiC, 4H-SiC, 6H-SiC, 15R-SiC, etc. Among them, the stacking sequence in the order of "ABCB" is called the 4H polytype. Although different polytypes of SiC have the same chemical composition, their physical properties, especially the bandgap width, carrier mobility and other characteristics are quite different. And the properties of 4H polytype are more suitable for semiconductor applications.

    The growth parameters such as temperature and pressure significantly influence the stability of 4H-SiC during growth process. Therefore, in order to obtain the single crystal material with high quality and uniformity, the parameters such as growth temperature, growth pressure and growth rate must be precisely controlled during the preparation.

Preparation Method of SiC: Physical Vapor Transport Method (PVT)

    At present, the preparation methods of Silicon Carbide are Physical Vapor Transport Method (PVT),High Temperature Chemical Vapor Deposition Method (HTCVD), and Liquid Phase Method (LPE). And PVT is a mainstream method that is suitable for industrial mass production.

    During PVT growth, SiC seed crystal is placed on the top of crucible while the source material (SiC powder) is placed in the bottom. In an enclosed environment with high temperature and low pressure, SiC powder sublimates, and then transports upward to the space near the seed under the effect of temperature gradient and concentration difference. And it will recrystallize after reaching the supersaturated state. Through this method, the size and polytype of SiC crystal can be controlled.

    However, the PVT method requires maintaining appropriate growth conditions throughout the entire growth process, otherwise it will lead to lattice disorder and form undesired defects. Besides, the SiC crystal growth is completed in an enclosed space with limited monitoring methods and many variables, thus the control of the process is difficult.

The Main Mechanism to Grow Single Crystal: Step Flow Growth

    In the process of growing SiC crystal by PVT method, step flow growth is considered as the main mechanism to form single crystals. The vaporized Si and C atoms will preferentially bond with the atoms on the crystal surface at steps and kinks, where they will nucleate and grow, so that each step flows forward in parallel. When the width between each step on the growth surface is far greater than the diffusion free path of the adsorbed atoms, a large number of adsorbed atoms may agglomerate, and form the two-dimensional island, which will destroy the step flow growth mode, resulting in the formation of other polytypes instead of 4H. Therefore, the adjustment of process parameters aims to control the step structure on the growth surface, so as to prevent the formation of undesired polytypes, and achieve the goal of obtaining 4H single crystal structure, and finally preparing high-quality crystals.

    The growth of the crystal is just the first step to prepare high quality SiC Substrate. Before being used, 4H-SiC ingot needs to go through a series of processes such as slicing, lapping, beveling, polishing, cleaning and inspecting. As a hard but brittle material, SiC single crystal also has high technical requirements for the wafering steps. Any damage generated in each process may have certain heredity, transfers to the next process and finally affect the product quality. Therefore, the efficient wafering technology for SiC Substrate also attracts the attention of the industry.

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P-type SiC substrate materials are mainly used for homoepitaxy and the fabrication of ultrahighvoltage powersemiconductor devices.
They are widely applied in smart grids represented by ultrahighvoltage power transmission,
as well as in rail transit and industrial highpower power supply fields.

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Specifications

6-inch
  • Diameter 150.0mm+0mm/-0.2mm
  • Surface Orientation 4°toward<1120>±0.5°
  • Primary Flat Length 47.5mm±1.5mm
  • Primary Flat Orientation <1120>±5.0°
  • Notch Orientation /
  • Notch Angle /
  • Notch Depth /
  • Thickness 350.0um±25.0um
  • Polytype 4H
  • Type p-type

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Specifications

8-inch
  • Diameter 200.0mm+0mm/-0.2mm
  • Surface Orientation 4°toward<1120>±0.5°
  • Primary Flat Length Notch
  • Primary Flat Orientation /
  • Notch Orientation <1100>±1.0°
  • Notch Angle 90°+5°/-1°
  • Notch Depth 1.0mm+0.25mm/-0mm
  • Thickness 350.0um±25.0um
  • Polytype 4H
  • Type p-type

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Specifications

12-inch
  • Diameter 300.0mm±0.5mm
  • Surface Orientation 4°toward<1120>±0.5°
  • Primary Flat Length Notch
  • Primary Flat Orientation /
  • Notch Orientation <1100>±5.0°
  • Notch Angle 90°+5°/-1°
  • Notch Depth 1.0mm+0.25mm/-0mm
  • Thickness 750.0um±25.0um
  • Polytype 4H
  • Type p-type

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The three-dimensional corner cut design of the letters highlights crystal element and three-dimensional sense,
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Web content is being updated

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2025
Listed on the Main Board of the Hong Kong Stock Exchange
Global debut of a full product series of 12-inch SiC substrates
Awarded the International Gold Award for Semiconductors (Electronic Materials Category)
2024
World\'s First 12-Inch Silicon Carbide Substrate
Launched Liquid-Phase P-Type Silicon Carbide Substrates
2023
Product delivery started in Shanghai Plant
2022
IPO on the STAR Market (688234)
Successful development of 8-inch products
Awarded as a National Model Enterprise of Intellectual Property
2021
Named National Champion Enterprise of Manufacturing Industry
2020
First Prize of Shandong Provincial Science and Technology Progress
2019
The global market share of S.I. SiC substrate was over 15%
2018
Named the National IP Leading Company
2017
First Prize of Jinan Science and Technology Progress
2015
The new headquarter plant construction completed and operation started
2014
First Prize of Shandong Provincial Technology Invention
2010
Founded with the registered capital of 60 million RMB
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Product Consultation

You can contact us through the following ways, or put forward your requirements online

Contact:Sales Department

Tel:0531-85978212
Fax:0531-85978212
E-mail:sales@sicc.cc
Address:No.99 South Tianyue Road, Huaiyin District, Jinan, Shandong.
Online input

Investors

Contact:Board of Directors Office
Tel:0531-69900616
Fax:0531-85978212
E-mail:dmo@sicc.cc
Address:No.99 South Tianyue Road, Huaiyin District, Jinan, Shandong.
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SICC was founded in 2010. It is a technologicalcompany focusing on the R&D, production and sales of silicon carbide (SiC)substrate material.

With the business philosophy of Technology ·Quality · Sustainability, SICC attaches importance to product and servicequality, takes meeting customer needs and helping customers solve problems asits work orientation. SICC actively expands the market and pursues sustainablebusiness development while mastering the process technology independently.

The SiC Single Crystal Substrate is a widebandgap semiconductor material. Compared with traditional materials, it hasbetter physical properties and can effectively improve the power density andoverall performance of devices. It can be widely used in fields of powerelectronics and microwave electronics.

But what behind the superior physicalproperties are sophisticated and complex preparation processes. The SiC signalcrystal grows in an enclosed environment with high temperature and low pressure.Any slight change in the environment may cause lattice disorder, which willaffect the crystal quality.

Relying on the experience of industrialization andthe R&D team, SICC keeps paying attention to technology leading and qualityimproving, and insists on continuous innovation. SICC will build integratedsolutions to improve service and product, and strives to become aninternational famous company of semiconductor materials.

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Product consultation

Contact: Sales Department
Tel: 0531-85978212
Fax: 0531-85978212
Email: sales@sicc.cc
Address: No. 99, Tianyue South Road, Huaiyin District, Jinan City, Shandong Province

Investor Relations

Contact: Office of the Board of Directors
Tel: 0531-69900616
Fax: 0531-85978212
Email: dmo@sicc.cc
Address: No. 99, Tianyue South Road, Huaiyin District, Jinan City, Shandong Province

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N-type SiC substrate materials are primarily used for homoepitaxial growth in the fabrication of power semiconductor devices.
They are widely applied in new energy sectors such as electric vehicles, as well as in photovoltaic and wind power generation.
Currently, SICC\'s 6-inch and 8-inch products are consistently delivered to global customers for volume production, while also
possessing the capability to produce 12-inchsubstrate products.

*Please contact our sales for more detailed information.

>Contact us

Specifications

6-inch
  • Diameter 150.0mm+0mm/-0.2mm
  • Surface Orientation 4°toward<1120>±0.5°
  • Primary Flat Length 47.5 mm ±1.5 mm
  • Primary Flat Orientation <1120>±1.0°
  • Notch Orientation /
  • Notch Angle /
  • Notch Depth /
  • Secondary Flat N/A
  • Thickness 350.0um士25.0um
  • Polytype 4H
  • Type n-type

*Please contact our sales for more detailed information.

>Contact us

Specifications

8-inch
  • Diameter 200.0mm+0mm/-0.5mm
  • Surface Orientation 4°toward<1120>±0.5°
  • Primary Flat Length Notch
  • Primary Flat Orientation /
  • Notch Orientation <1100>±1.0°
  • Notch Angle 90°+5°/-1°
  • Notch Depth 1.0mm+0.25mm/-0mm
  • Secondary Flat N/A
  • Thickness 500.0um士25.0um
  • Polytype 4H
  • Type n-type

*Please contact our sales for more detailed information.

>Contact us

Specifications

12-inch
  • Diameter 300.0mm+0mm/-0.5mm
  • Surface Orientation 4°toward<1120>±0.5°
  • Primary Flat Length Notch
  • Primary Flat Orientation /
  • Notch Orientation <1100>±5.0°
  • Notch Angle 90°+5°/-1°
  • Notch Depth 1.0mm+0.25mm/-0mm
  • Secondary Flat N/A
  • Thickness 750.0um士25.0um
  • Polytype 4H
  • Type n-type

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What is Silicon Carbide

Compared with traditional materials, silicon carbide has excellent physical properties,
which can reduce weight and improve efficiency for discrete devices, modules and even systems

SiC

Si(silicon)+C(carbon)=SiC
Silicon carbide is a group IV - IV compound semiconductor material formed by C and Si elements in the ratio of 1:1,
and its hardness is second only to diamond.
This semiconductor material has great development potential, but is hard and brittle.
The preparation process is complex and the processing is difficult.

SiC Features

Excellent physical properties
Wide bandgap (High temperature resistance)1
High critical breakdown field(High voltage resistance2
High thermal conductivity(Heat dissipation)3
Saturated electron drift velocity(High switching speed)4
4H-SiC Si GaAs GaN
Wide bandgap(eV)1 3.26 1.12 1.42 3.42
High critical breakdown field(MV/cm)2 2.8 0.3 0.4 3
High thermal conductivity(W/cmK)3 4.9 1.5 0.46 1.3
Saturated electron drift velocity(1E7 cm/s)4 2.7 1 2 2.7
1.A wider bandgap can ensure that electrons are not easy to transit and intrinsic excitation is weak at high temperature. Thus, it can withstand higher operating temperature.
The bandgap width of silicon carbide is three times that of silicon, and its theoretical working temperature can reach more than 400 ℃.

2.Critical breakdown field strength refers to the electric field strength in electric breakdown. Once this value is exceeded, the material will lose its insulation performance.
It determines the voltage resistance of a material.
The critical field strength of silicon carbide is about 10 times that of Si, which can withstand higher voltage and is more suitable for high voltage devices.

3.Heat is one of the main reasons affecting the lifetime of devices.
The thermal conductivity represents the material\'s ability to conduct heat.
The high thermal conductivity of silicon carbide can effectively conduct heat, reduce the device temperature and maintain its normal operation. 

4.The saturated electron drift velocity refers to the maximum directional moving speed of electrons in semiconductor materials.
It determines the switching frequency of devices.
The saturated electron drift velocity of silicon carbide is twice that of silicon, which can miniaturize the device and improve efficiency.

SiC Applications

Power Electronics Devices

SiC power devices have unique advantages such as high voltage, high current, high temperature, high frequency and low loss, which will greatly improve the energy conversion efficiency of existing silicon based power devices and have a significant and far-reaching impact on the field of efficient energy conversion.
The main application fields are electric vehicles, charging piles, photovoltaic new energy, rail transit, smart grid, etc.

Microwave Communication

Silicon carbide based gallium nitride RF devices have been successfully applied in many fields, mainly in wireless communication infrastructure.
Silicon carbide as substrate gallium nitride RF devices have both good thermal conductivity of silicon carbide and advantages of high-power RF output of gallium nitride in high frequency band, which can provide the power and efficiency required by the next generation of high frequency telecommunication network and become the mainstream choice of 5G base station power amplifier.
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Directors, Supervisors and Senior Management
董事
  • 宗艳民先生

    宗艳民先生,61岁,本科学历,为本公司的董事长、执行董事兼总经理,于2010年11月2日获委任为董事,并于2025年2月19日获调整董事角色为执行董事。
    宗先生在半导体材料的技术研发与产业化、工程以及企业管理领域拥有逾35年经验。2010年11月,宗先生创立了本公司前身山东太阳成集团tyc33455cc官网材料科技有限公司,并于2010年11月至2020年11月期间历任董事会主席、执行董事及总经理。自2020年11月起,宗先生一直担任本公司董事长、董事兼总经理。
  • 高超先生

    高超先生,38岁,博士学历,为本公司执行董事兼首席技术官。彼于2019年8月15日获委任为董事,并于2025年2月19日获调整董事角色为执行董事。
    高先生于半导体材料技术研发及产业化领域拥有逾十年经验。于2014年7月至2020年11月期间,彼先后在本公司前身山东太阳成集团tyc33455cc官网材料科技有限公司担任研发工程师、研发中心主任、董事兼研发中心主任。自2020年11月起,高先生一直担任本公司的董事兼首席技术官。
  • 王俊国先生

    王俊国先生,47岁,于2025年7月2日获委任为董事,并于同日获调整董事角色为执行董事。
    王先生在财务管理领域拥有丰富经验。彼于2016年8月至2020年11月期间担任本公司前身山东太阳成集团tyc33455cc官网材料科技有限公司财务总监,并自2020年11月起担任本公司财务总监,并自2024年8月起担任我们的证券事务代表。
  • 邱宇峰先生

    邱宇峰先生,65岁,硕士学历,于2024年2月29日获委任为董事,并于2025年2月19日获调整董事角色为非执行董事。邱先生于2020年11月至2021年1月期间担任本公司独立董事。
    邱先生在电力及半导体技术研发领域拥有逾30年经验。于1994年6月至1999年11月期间,彼先后在中国电力科学研究院电力系统研究所担任继电保护室主任及副所长;于1999年11月至2006年12月期间,彼在中国电力科学研究院输配电及节电 技术国家工程研究中心担任常务副主任;于2006年12月至2012年2月期间,彼在中国电力科学研究院担任副院长。邱先生于2012年2月至2020年2月期间,先后在全球能源互联网研究院有限公司(前称国网智能电网研究院)担任多个职位,包括副院长、院长、顾问及其他职位。邱先生现任厦门大学讲座教授,以及自2022年4月起担任博测锐创半导体科技(苏州)有限公司董事会主席兼总经理,自2022年5月起担任北京博测半导体科技有限公司执行董事兼总经理,自2023年6月起担任思源电气股份有限公司(一家于深圳证券交易所上市的公司(股票代码:002028))的独立董事,并自2023年9月起担任北京顺德盛企业管理合伙企业(有限合伙)的执行事务合伙人。
  • 李婉越女士

    李婉越女士,54岁,硕士学历,于2025年2月19日获委任为董事,并于同日获调整董事角色为非执行董事。
    李女士在会计及融资领域拥有30年经验。彼于1994年7月至1999年7月期间任职于北京新型建筑材料总厂,离职前为助理会计师。 于1999年10月至2020年12月期间,李女士先后在北新建材(集团)有限公司担任多个职位,包括财务部会计、财务部经理及其他职位。自2022年12月起,彼一直担任中建材联合投资有限公司的总会计师。
  • 方伟先生

    方伟先生,50岁,硕士学历,于2024年2月29日获委任为董事,并于2025年2月19日获重新委任为非执行董事。
    方先生在无线产品工程及企业管理领域拥有逾25年经验。自1999年2月起,彼任职于一家从事ICT(信息与通信)基础设施和智能终端提供商业务的全球性企业,现任第五轨道外派董事。自2023年12月起,彼亦担任苏州东微半导体股份有限公司(一家于上海证券交易所上市的公司(股票代码:688261))董事。
  • 李洪辉先生

    李洪辉先生,61岁,博士学历,于2024年2月29日获委任为独立董事,并于2025年2月19日获调整董事角色为独立非执行董事。
    李先生在财务管理领域拥有丰富的经验。彼任职于中华人民共和国财政部至2014年8月,最后职位为投资评审中心副主任。彼亦于2014年8月至2018年7月期间担任中国信达资产管理股份有限公司(一家于香港联交所上市的公司(股份代号:1359))董事。李先生于2018年担任中华人民共和国财政部预算评审中心副主任。彼亦担任中海外科技开发有限公司董事长至2019年11月。自2022年6月起至2024年1月期间,彼担任北京中财宝信管理咨询有限公司执行董事。李先生自2023年6月起,担任中润辉铭(海南)投资有限公司执行董事、总经理兼财务总监;自2023年10月起, 担任华大卓越(北京)投资管理有限公司(前称北京百家信诚投资管理有限公司)执行董事、总经理兼财务总监;自2024年8月起,担任吉林省北药科技有限公司总经理;并自2024年10月起,担任辽宁北药金吉科技发展有限公司监事。
  • 刘华女士

    刘华女士,56岁,本科学历,于2024年2月29日获委任为独立董事,并于2025年2月19日获调整董事角色为独立非执行董事。 刘女士在法律、监管及合规治理领域拥有丰富经验。彼于1992年7月至2002年3月期间在山东三联集团有限责任公司任职。于2002年7月至2007年2月及2007年2月至2008年7月,刘女士分别担任山东康桥律师事务所及北京天驰君泰律师事务所律师。于2008年8月至2019年10月期间,彼担任山东森信律师事务所合伙人及律师。自2019年11月起,刘女士担任北京天驰君泰(济南)律师事务所合伙人及律师。
  • 黎国鸿先生

    黎国鸿先生,61岁,硕士学历,于2025年2月19日获委任为独立董事,并于同日获调整董事角色为独立非执行董事。 黎先生在企业管治以及财务咨询及管理领域拥有丰富经验。彼于1989年7月至1996年8月期间前后在德勤·关黄陈方会计师行担任会计专员、高级会计师及经理。于1997年4月至2006年12月期间,黎先生就职于冠亚商业集团有限公司(一家于香港联交所上市的公司(股份代号:0104)),彼担任的最后职务为公司秘书兼财务总监。于2007年1月至2013年4月期间,黎先生在德祥地产集团有限公司(一家于香港联交所上市的公司(股份代号:0199))担任财务总监及在德祥企业集团有限公司(一家于香港联交所上市的公司(股份代号:0372))担任首席财务官兼公司秘书。自2013年8月起,黎先生在盛洋投资(控股)有限公司(一家于香港联交所上市的公司(股份代号:0174)) 担任执行董事及董事会投资委员会成员,并自2020年12月起兼任首席执行官。自2017年2月起,彼在桦欣控股有限公司(一家于香港联交所上市的公司(股份代号:1657))担任独立非执行董事。
监事
  • 张红岩女士

    张红岩女士,38岁,硕士学历,于2020年11月7日获委任为监事兼监事会主席。 张女士在技术工程领域拥有丰富经验。彼先后于2012年4月至2020年11月期间担任本公司前身山东太阳成集团tyc33455cc官网材料科技有限公司质量部技术员、技术中心主管、销售技术支持及质量部经理。自2020年11月起,彼担任本公司质量部负责人及监事。
  • 宋建先生

    宋建先生,38岁,于2020年11月7日获委任为监事。 宋先生在碳化硅研发领域拥有丰富经验。彼先后于2011年8月至2020年11月期间担任本公司前身山东太阳成集团tyc33455cc官网材料科技有限公司碳化硅事业部技术员及负责人、技术中心主管及设备动力部经理。自2020年11月起,彼担任本公司工程部负责人及监事。
  • 窦文涛先生

    窦文涛先生,42岁,于2024年8月22日获委任为监事。 窦先生在项目管理及企业管治领域拥有丰富经验。窦先生先后于2010年10月至2020年11月期间担任本公司前身山东太阳成集团tyc33455cc官网材料科技有限公司项目经理、销售部经理、执行董事(代)及董事长助理。自2020年11月起,彼担任本公司董事长助理。
高级管理人员
  • 宗艳民先生

    宗艳民先生,61岁,本科学历,为本公司的董事长、执行董事兼总经理,于2010年11月2日获委任为董事,并于2025年2月19日获调整董事角色为执行董事。 宗先生在半导体材料的技术研发与产业化、工程以及企业管理领域拥有逾35年经验。2010年11月,宗先生创立了本公司前身山东太阳成集团tyc33455cc官网材料科技有限公司,并于2010年11月至2020年11月期间历任董事会主席、执行董事及总经理。自2020年11月起,宗先生一直担任本公司董事长、董事兼总经理。
  • 高超先生

    高超先生,38岁,博士学历,为本公司执行董事兼首席技术官。彼于2019年8月15日获委任为董事,并于2025年2月19日获调整董事角色为执行董事。 高先生于半导体材料技术研发及产业化领域拥有逾十年经验。于2014年7月至2020年11月期间,彼先后在本公司前身山东太阳成集团tyc33455cc官网材料科技有限公司担任研发工程师、研发中心主任、董事兼研发中心主任。自2020年11月起,高先生一直担任本公司的董事兼首席技术官。
  • 钟文庆先生

    钟文庆先生,57岁,自2022年8月起担任本公司董事会秘书。钟先生于2018年12月加入本集团,并先后于2018年12月至2019年8月期间担任本公司首席财务官,于2019年8月至2023年4月期间担任董事兼首席财务官,并于2023年4月至2024年2月期间担任董事。钟先生目前还在本公司的若干子公司中担任董事及╱或监事职务。 钟先生在会计与财务管理、资本市场及企业管治领域拥有逾25年经验。在加入本集团之前,彼于1998年1月至1999年2月期间在通用磨坊(中国)投资有限公司的品食乐大中华区担任财务经理。在美国施乐中国有限公司工作期间,钟先生担任财务总监及市场总监。其后彼于2003年12月至2005年4月在西门子工业软件(上海)有限公司担任财务分析高级经理。钟先生于2005年6月加入沃尔沃建筑设备(中国)有限公司并担任沃尔沃建筑设备公司中国区首席财务官。钟先生于2011年1月至2018年11月期间担任瑞迈国际有限公司总裁。
  • 游樱女士

    游樱女士,50岁,自2024年9月起担任本公司首席财务官。游女士自2024年4月加入本集团起一直担任上海太阳成集团tyc33455cc的财务总监。 游女士在会计与财务管理领域拥有逾25年经验。在加入本集团之前,彼于1998年7月至2004年12月期间在山东干聚有限责任会计师事务所担任审计经理。游女士于2004年12月至2024年3月期间在上汽通用东岳汽车有限公司担任高级财务经理。
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Our mission

To achieve greater profits for shareholders
To provide better products and services for customers
To offer better development platform and benefits for employees
To create greater value and wealth for the society

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Product Consultation

You can contact us through the following ways, or put forward your requirements online

Contact:Sales Department

Tel:0531-85978212
Fax:0531-85978212
E-mail:sales@sicc.cc
Address:No.99 South Tianyue Road, Huaiyin District, Jinan, Shandong.
Online input

Investors

Contact:Board of Directors Office
Tel:0531-69900616
Fax:0531-85978212
E-mail:dmo@sicc.cc
Address:No.99 South Tianyue Road, Huaiyin District, Jinan, Shandong.
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The Semi-insulating SiC substrates have high resistivity and are mainly used for GaN heteroepitaxy.
The RF devices represented by HEMT combine the excellent thermal conductivity of SiC with the high-power Rf output of
GaN in high-frequency range, and are widely applied in the new generation communication field such as the 5G stations.
Semi-insulating Sic substrate materials also exhibit excellent optical properties.
The 12-inch substrates show promising application prospects in optical and wearable electronics, such as AR glasses.

*Please contact our sales for more detailed information.

>Contact us

Specifications

6-inch
  • Diameter 150.0mm+0mm/-0.2mm
  • Surface Orientation {0001}±0.2°
  • Primary Flat Orientation /
  • Secondary Flat Orientation /
  • Primary Flat Length Notch
  • Secondary Flat Length None
  • Notch Orientation <1100>±1.0°
  • Notch Depth None1mm+0.25mm/-0mm from edge
  • Notch Angle 90°+5°/-1°
  • Thickness 500.0um±25.0um
  • Type Semi-insulating

*Please contact our sales for more detailed information.

>Contact us

Specifications

8-inch
  • Diameter 200.0mm+0mm/-0.5mm
  • Surface Orientation {0001}±0.2°
  • Primary Flat Orientation /
  • Secondary Flat Orientation /
  • Primary Flat Length Notch
  • Secondary Flat Length None
  • Notch Orientation <1100>±1.0°
  • Notch Depth None1mm+0.25mm/-0mm from edge
  • Notch Angle 90°+5°/-1°
  • Thickness 500.0um±25.0um
  • Type Semi-insulating

*Please contact our sales for more detailed information.

>Contact us

Specifications

12-inch
  • Diameter 300.0mm+0mm/-0.5mm
  • Surface Orientation {0001}±0.5°
  • Primary Flat Orientation /
  • Secondary Flat Orientation /
  • Primary Flat Length Notch
  • Secondary Flat Length None
  • Notch Orientation <1100>±5.0°
  • Notch Depth None1mm+0.25mm/-0mm from edge
  • Notch Angle 90°+5°/-1°
  • Thickness 750.0um±25.0um
  • Type Semi-insulating

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Production Process of SiC Single Crystal

Silicon carbide single crystal is extremely rare in nature and can only be prepared by artificial synthesis. At present, the industrial production of silicon carbide substrate is mainly based on PVT method. This method needs to sublimate the powder with high temperature and vacuum, and then let the components grow on the seed surface through thermal field control, so as to obtain the silicon carbide crystals. The whole process is completed in an enclosed space, with few effective monitoring and many variables, which requires high process control accuracy.

SICC independently own the whole process from SiC powder to crystal growth and wafering.
1.

SiC Powder

Si+C=SiCPowder
Si and C are synthesized to SiC polycrystalline particles in the ratio of 1:1
SiC powder is the source of crystal growth, and its particle size and purity will directly affect the crystal quality
Especially in the preparation of semi-insulating substrate, the requirement of powder purity is very high
(Impurity content<0.5ppm)
2.

Seed

As the base of crystal growth, it provides the basic lattice structure for crystal growth
It is also the core raw material for crystal quality
3.

Crystal Growth

Physical Vapor Transport(PVT)
The raw materials are heated,
and the sublimated components recrystallize on the seed surface through vapor sublimation and thermal field control
4.

Slicing

SiC is a hard and brittle material whose hardness is second only to diamond
Therefore, it takes long time for slicing, and is easy to crack.
5.

Lapping•Polishing

MP·CMP
Lapping and polishing is to process the substrate surface to nano smooth mirror, which is Epi-ready
The surface state of substrate, such as surface roughness and thickness uniformity, will directly affect the quality of epitaxy and then affect the quality of devices.
6.

Cleaning • Inspection

To remove residual particles and metal impurities in the wafering processes
The final inspection can retain complete quality information such as substrate surface, surface flatness and crystal quality
It helps to trace for the downstream process
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Approaching SiC | The Principle of Silicon Carbide Crystal Growth

    In nature, crystals are everywhere, and their distribution and application are very extensive. Salt, sugar, diamond and snowflakes are all crystals that can be seen in daily life; Besides, crystal materials such as semiconductor crystal, laser crystal, scintillation crystal, and super-hard crystal also play an important role in industry, medical treatment, semiconductor, and many scientific research fields.

    Different crystals have different structures, properties and preparation methods. But their common feature is that the atoms in the crystal are regularly arranged, and the lattice with a specific structure is then formed through periodic stacking in three-dimensional space. Therefore, the appearance of crystal materials usually presents a regular geometric shape.

    Silicon Carbide Single Crystal Substrate Material (hereinafter referred to as SiC Substrate) is also a kind of crystalline materials. It belongs to wide bandgap semiconductor material, and has the advantages of high voltage resistance, high temperature resistance, high frequency, low loss, etc. It is a basic material for preparing high-power electronic devices and microwave RF devices.

The Crystal Structure of SiC

    SiC is a IV-IV compound semiconductor material composed of Carbon and Silicon in a stoichiometric ratio of 1:1, and its hardness is second only to diamond.

    Both Carbon and Silicon atoms have 4 valence electrons, which can form 4 covalent bonds. The basic structural unit of SiC crystal, SiC tetrahedron, arises out of the tetrahedral bonding between Silicon and Carbon atoms. The coordination number of both Silicon and Carbon atoms is 4, i.e. each Carbon atom has 4 Silicon atoms around it and each Silicon atom also has 4 Carbon atoms around it.

    As a crystal material, SiC Substrate also has the characteristic of periodic stacking of atomic layers. The Si-C diatomic layers are stacked along [0001] direction.Due to the small difference in bond energy between layers, different connection modes are easily generated between atomic layers, leading to over 200 SiC polytypes. Common polytypes include 2H-SiC, 3C-SiC, 4H-SiC, 6H-SiC, 15R-SiC, etc. Among them, the stacking sequence in the order of "ABCB" is called the 4H polytype. Although different polytypes of SiC have the same chemical composition, their physical properties, especially the bandgap width, carrier mobility and other characteristics are quite different. And the properties of 4H polytype are more suitable for semiconductor applications.

    The growth parameters such as temperature and pressure significantly influence the stability of 4H-SiC during growth process. Therefore, in order to obtain the single crystal material with high quality and uniformity, the parameters such as growth temperature, growth pressure and growth rate must be precisely controlled during the preparation.

Preparation Method of SiC: Physical Vapor Transport Method (PVT)

    At present, the preparation methods of Silicon Carbide are Physical Vapor Transport Method (PVT),High Temperature Chemical Vapor Deposition Method (HTCVD), and Liquid Phase Method (LPE). And PVT is a mainstream method that is suitable for industrial mass production.

    During PVT growth, SiC seed crystal is placed on the top of crucible while the source material (SiC powder) is placed in the bottom. In an enclosed environment with high temperature and low pressure, SiC powder sublimates, and then transports upward to the space near the seed under the effect of temperature gradient and concentration difference. And it will recrystallize after reaching the supersaturated state. Through this method, the size and polytype of SiC crystal can be controlled.

    However, the PVT method requires maintaining appropriate growth conditions throughout the entire growth process, otherwise it will lead to lattice disorder and form undesired defects. Besides, the SiC crystal growth is completed in an enclosed space with limited monitoring methods and many variables, thus the control of the process is difficult.

The Main Mechanism to Grow Single Crystal: Step Flow Growth

    In the process of growing SiC crystal by PVT method, step flow growth is considered as the main mechanism to form single crystals. The vaporized Si and C atoms will preferentially bond with the atoms on the crystal surface at steps and kinks, where they will nucleate and grow, so that each step flows forward in parallel. When the width between each step on the growth surface is far greater than the diffusion free path of the adsorbed atoms, a large number of adsorbed atoms may agglomerate, and form the two-dimensional island, which will destroy the step flow growth mode, resulting in the formation of other polytypes instead of 4H. Therefore, the adjustment of process parameters aims to control the step structure on the growth surface, so as to prevent the formation of undesired polytypes, and achieve the goal of obtaining 4H single crystal structure, and finally preparing high-quality crystals.

    The growth of the crystal is just the first step to prepare high quality SiC Substrate. Before being used, 4H-SiC ingot needs to go through a series of processes such as slicing, lapping, beveling, polishing, cleaning and inspecting. As a hard but brittle material, SiC single crystal also has high technical requirements for the wafering steps. Any damage generated in each process may have certain heredity, transfers to the next process and finally affect the product quality. Therefore, the efficient wafering technology for SiC Substrate also attracts the attention of the industry.

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P-type SiC substrate materials are mainly used for homoepitaxy and the fabrication of ultrahighvoltage powersemiconductor devices.
They are widely applied in smart grids represented by ultrahighvoltage power transmission,
as well as in rail transit and industrial highpower power supply fields.

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Specifications

6-inch
  • Diameter 150.0mm+0mm/-0.2mm
  • Surface Orientation 4°toward<1120>±0.5°
  • Primary Flat Length 47.5mm±1.5mm
  • Primary Flat Orientation <1120>±5.0°
  • Notch Orientation /
  • Notch Angle /
  • Notch Depth /
  • Thickness 350.0um±25.0um
  • Polytype 4H
  • Type p-type

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Specifications

8-inch
  • Diameter 200.0mm+0mm/-0.2mm
  • Surface Orientation 4°toward<1120>±0.5°
  • Primary Flat Length Notch
  • Primary Flat Orientation /
  • Notch Orientation <1100>±1.0°
  • Notch Angle 90°+5°/-1°
  • Notch Depth 1.0mm+0.25mm/-0mm
  • Thickness 350.0um±25.0um
  • Polytype 4H
  • Type p-type

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Specifications

12-inch
  • Diameter 300.0mm±0.5mm
  • Surface Orientation 4°toward<1120>±0.5°
  • Primary Flat Length Notch
  • Primary Flat Orientation /
  • Notch Orientation <1100>±5.0°
  • Notch Angle 90°+5°/-1°
  • Notch Depth 1.0mm+0.25mm/-0mm
  • Thickness 750.0um±25.0um
  • Polytype 4H
  • Type p-type

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Web content is being updated

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2025
Listed on the Main Board of the Hong Kong Stock Exchange
Global debut of a full product series of 12-inch SiC substrates
Awarded the International Gold Award for Semiconductors (Electronic Materials Category)
2024
World\'s First 12-Inch Silicon Carbide Substrate
Launched Liquid-Phase P-Type Silicon Carbide Substrates
2023
Product delivery started in Shanghai Plant
2022
IPO on the STAR Market (688234)
Successful development of 8-inch products
Awarded as a National Model Enterprise of Intellectual Property
2021
Named National Champion Enterprise of Manufacturing Industry
2020
First Prize of Shandong Provincial Science and Technology Progress
2019
The global market share of S.I. SiC substrate was over 15%
2018
Named the National IP Leading Company
2017
First Prize of Jinan Science and Technology Progress
2015
The new headquarter plant construction completed and operation started
2014
First Prize of Shandong Provincial Technology Invention
2010
Founded with the registered capital of 60 million RMB
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Product Consultation

You can contact us through the following ways, or put forward your requirements online

Contact:Sales Department

Tel:0531-85978212
Fax:0531-85978212
E-mail:sales@sicc.cc
Address:No.99 South Tianyue Road, Huaiyin District, Jinan, Shandong.
Online input

Investors

Contact:Board of Directors Office
Tel:0531-69900616
Fax:0531-85978212
E-mail:dmo@sicc.cc
Address:No.99 South Tianyue Road, Huaiyin District, Jinan, Shandong.
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SICC was founded in 2010. It is a technologicalcompany focusing on the R&D, production and sales of silicon carbide (SiC)substrate material.

With the business philosophy of Technology ·Quality · Sustainability, SICC attaches importance to product and servicequality, takes meeting customer needs and helping customers solve problems asits work orientation. SICC actively expands the market and pursues sustainablebusiness development while mastering the process technology independently.

The SiC Single Crystal Substrate is a widebandgap semiconductor material. Compared with traditional materials, it hasbetter physical properties and can effectively improve the power density andoverall performance of devices. It can be widely used in fields of powerelectronics and microwave electronics.

But what behind the superior physicalproperties are sophisticated and complex preparation processes. The SiC signalcrystal grows in an enclosed environment with high temperature and low pressure.Any slight change in the environment may cause lattice disorder, which willaffect the crystal quality.

Relying on the experience of industrialization andthe R&D team, SICC keeps paying attention to technology leading and qualityimproving, and insists on continuous innovation. SICC will build integratedsolutions to improve service and product, and strives to become aninternational famous company of semiconductor materials.

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Product consultation

Contact: Sales Department
Tel: 0531-85978212
Fax: 0531-85978212
Email: sales@sicc.cc
Address: No. 99, Tianyue South Road, Huaiyin District, Jinan City, Shandong Province

Investor Relations

Contact: Office of the Board of Directors
Tel: 0531-69900616
Fax: 0531-85978212
Email: dmo@sicc.cc
Address: No. 99, Tianyue South Road, Huaiyin District, Jinan City, Shandong Province

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N-type SiC substrate materials are primarily used for homoepitaxial growth in the fabrication of power semiconductor devices.
They are widely applied in new energy sectors such as electric vehicles, as well as in photovoltaic and wind power generation.
Currently, SICC\'s 6-inch and 8-inch products are consistently delivered to global customers for volume production, while also
possessing the capability to produce 12-inchsubstrate products.

*Please contact our sales for more detailed information.

>Contact us

Specifications

6-inch
  • Diameter 150.0mm+0mm/-0.2mm
  • Surface Orientation 4°toward<1120>±0.5°
  • Primary Flat Length 47.5 mm ±1.5 mm
  • Primary Flat Orientation <1120>±1.0°
  • Notch Orientation /
  • Notch Angle /
  • Notch Depth /
  • Secondary Flat N/A
  • Thickness 350.0um士25.0um
  • Polytype 4H
  • Type n-type

*Please contact our sales for more detailed information.

>Contact us

Specifications

8-inch
  • Diameter 200.0mm+0mm/-0.5mm
  • Surface Orientation 4°toward<1120>±0.5°
  • Primary Flat Length Notch
  • Primary Flat Orientation /
  • Notch Orientation <1100>±1.0°
  • Notch Angle 90°+5°/-1°
  • Notch Depth 1.0mm+0.25mm/-0mm
  • Secondary Flat N/A
  • Thickness 500.0um士25.0um
  • Polytype 4H
  • Type n-type

*Please contact our sales for more detailed information.

>Contact us

Specifications

12-inch
  • Diameter 300.0mm+0mm/-0.5mm
  • Surface Orientation 4°toward<1120>±0.5°
  • Primary Flat Length Notch
  • Primary Flat Orientation /
  • Notch Orientation <1100>±5.0°
  • Notch Angle 90°+5°/-1°
  • Notch Depth 1.0mm+0.25mm/-0mm
  • Secondary Flat N/A
  • Thickness 750.0um士25.0um
  • Polytype 4H
  • Type n-type

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What is Silicon Carbide

Compared with traditional materials, silicon carbide has excellent physical properties,
which can reduce weight and improve efficiency for discrete devices, modules and even systems

SiC

Si(silicon)+C(carbon)=SiC
Silicon carbide is a group IV - IV compound semiconductor material formed by C and Si elements in the ratio of 1:1,
and its hardness is second only to diamond.
This semiconductor material has great development potential, but is hard and brittle.
The preparation process is complex and the processing is difficult.

SiC Features

Excellent physical properties
Wide bandgap (High temperature resistance)1
High critical breakdown field(High voltage resistance2
High thermal conductivity(Heat dissipation)3
Saturated electron drift velocity(High switching speed)4
4H-SiC Si GaAs GaN
Wide bandgap(eV)1 3.26 1.12 1.42 3.42
High critical breakdown field(MV/cm)2 2.8 0.3 0.4 3
High thermal conductivity(W/cmK)3 4.9 1.5 0.46 1.3
Saturated electron drift velocity(1E7 cm/s)4 2.7 1 2 2.7
1.A wider bandgap can ensure that electrons are not easy to transit and intrinsic excitation is weak at high temperature. Thus, it can withstand higher operating temperature.
The bandgap width of silicon carbide is three times that of silicon, and its theoretical working temperature can reach more than 400 ℃.

2.Critical breakdown field strength refers to the electric field strength in electric breakdown. Once this value is exceeded, the material will lose its insulation performance.
It determines the voltage resistance of a material.
The critical field strength of silicon carbide is about 10 times that of Si, which can withstand higher voltage and is more suitable for high voltage devices.

3.Heat is one of the main reasons affecting the lifetime of devices.
The thermal conductivity represents the material\'s ability to conduct heat.
The high thermal conductivity of silicon carbide can effectively conduct heat, reduce the device temperature and maintain its normal operation. 

4.The saturated electron drift velocity refers to the maximum directional moving speed of electrons in semiconductor materials.
It determines the switching frequency of devices.
The saturated electron drift velocity of silicon carbide is twice that of silicon, which can miniaturize the device and improve efficiency.

SiC Applications

Power Electronics Devices

SiC power devices have unique advantages such as high voltage, high current, high temperature, high frequency and low loss, which will greatly improve the energy conversion efficiency of existing silicon based power devices and have a significant and far-reaching impact on the field of efficient energy conversion.
The main application fields are electric vehicles, charging piles, photovoltaic new energy, rail transit, smart grid, etc.

Microwave Communication

Silicon carbide based gallium nitride RF devices have been successfully applied in many fields, mainly in wireless communication infrastructure.
Silicon carbide as substrate gallium nitride RF devices have both good thermal conductivity of silicon carbide and advantages of high-power RF output of gallium nitride in high frequency band, which can provide the power and efficiency required by the next generation of high frequency telecommunication network and become the mainstream choice of 5G base station power amplifier.
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Directors, Supervisors and Senior Management
董事
  • 宗艳民先生

    宗艳民先生,61岁,本科学历,为本公司的董事长、执行董事兼总经理,于2010年11月2日获委任为董事,并于2025年2月19日获调整董事角色为执行董事。
    宗先生在半导体材料的技术研发与产业化、工程以及企业管理领域拥有逾35年经验。2010年11月,宗先生创立了本公司前身山东太阳成集团tyc33455cc官网材料科技有限公司,并于2010年11月至2020年11月期间历任董事会主席、执行董事及总经理。自2020年11月起,宗先生一直担任本公司董事长、董事兼总经理。
  • 高超先生

    高超先生,38岁,博士学历,为本公司执行董事兼首席技术官。彼于2019年8月15日获委任为董事,并于2025年2月19日获调整董事角色为执行董事。
    高先生于半导体材料技术研发及产业化领域拥有逾十年经验。于2014年7月至2020年11月期间,彼先后在本公司前身山东太阳成集团tyc33455cc官网材料科技有限公司担任研发工程师、研发中心主任、董事兼研发中心主任。自2020年11月起,高先生一直担任本公司的董事兼首席技术官。
  • 王俊国先生

    王俊国先生,47岁,于2025年7月2日获委任为董事,并于同日获调整董事角色为执行董事。
    王先生在财务管理领域拥有丰富经验。彼于2016年8月至2020年11月期间担任本公司前身山东太阳成集团tyc33455cc官网材料科技有限公司财务总监,并自2020年11月起担任本公司财务总监,并自2024年8月起担任我们的证券事务代表。
  • 邱宇峰先生

    邱宇峰先生,65岁,硕士学历,于2024年2月29日获委任为董事,并于2025年2月19日获调整董事角色为非执行董事。邱先生于2020年11月至2021年1月期间担任本公司独立董事。
    邱先生在电力及半导体技术研发领域拥有逾30年经验。于1994年6月至1999年11月期间,彼先后在中国电力科学研究院电力系统研究所担任继电保护室主任及副所长;于1999年11月至2006年12月期间,彼在中国电力科学研究院输配电及节电 技术国家工程研究中心担任常务副主任;于2006年12月至2012年2月期间,彼在中国电力科学研究院担任副院长。邱先生于2012年2月至2020年2月期间,先后在全球能源互联网研究院有限公司(前称国网智能电网研究院)担任多个职位,包括副院长、院长、顾问及其他职位。邱先生现任厦门大学讲座教授,以及自2022年4月起担任博测锐创半导体科技(苏州)有限公司董事会主席兼总经理,自2022年5月起担任北京博测半导体科技有限公司执行董事兼总经理,自2023年6月起担任思源电气股份有限公司(一家于深圳证券交易所上市的公司(股票代码:002028))的独立董事,并自2023年9月起担任北京顺德盛企业管理合伙企业(有限合伙)的执行事务合伙人。
  • 李婉越女士

    李婉越女士,54岁,硕士学历,于2025年2月19日获委任为董事,并于同日获调整董事角色为非执行董事。
    李女士在会计及融资领域拥有30年经验。彼于1994年7月至1999年7月期间任职于北京新型建筑材料总厂,离职前为助理会计师。 于1999年10月至2020年12月期间,李女士先后在北新建材(集团)有限公司担任多个职位,包括财务部会计、财务部经理及其他职位。自2022年12月起,彼一直担任中建材联合投资有限公司的总会计师。
  • 方伟先生

    方伟先生,50岁,硕士学历,于2024年2月29日获委任为董事,并于2025年2月19日获重新委任为非执行董事。
    方先生在无线产品工程及企业管理领域拥有逾25年经验。自1999年2月起,彼任职于一家从事ICT(信息与通信)基础设施和智能终端提供商业务的全球性企业,现任第五轨道外派董事。自2023年12月起,彼亦担任苏州东微半导体股份有限公司(一家于上海证券交易所上市的公司(股票代码:688261))董事。
  • 李洪辉先生

    李洪辉先生,61岁,博士学历,于2024年2月29日获委任为独立董事,并于2025年2月19日获调整董事角色为独立非执行董事。
    李先生在财务管理领域拥有丰富的经验。彼任职于中华人民共和国财政部至2014年8月,最后职位为投资评审中心副主任。彼亦于2014年8月至2018年7月期间担任中国信达资产管理股份有限公司(一家于香港联交所上市的公司(股份代号:1359))董事。李先生于2018年担任中华人民共和国财政部预算评审中心副主任。彼亦担任中海外科技开发有限公司董事长至2019年11月。自2022年6月起至2024年1月期间,彼担任北京中财宝信管理咨询有限公司执行董事。李先生自2023年6月起,担任中润辉铭(海南)投资有限公司执行董事、总经理兼财务总监;自2023年10月起, 担任华大卓越(北京)投资管理有限公司(前称北京百家信诚投资管理有限公司)执行董事、总经理兼财务总监;自2024年8月起,担任吉林省北药科技有限公司总经理;并自2024年10月起,担任辽宁北药金吉科技发展有限公司监事。
  • 刘华女士

    刘华女士,56岁,本科学历,于2024年2月29日获委任为独立董事,并于2025年2月19日获调整董事角色为独立非执行董事。 刘女士在法律、监管及合规治理领域拥有丰富经验。彼于1992年7月至2002年3月期间在山东三联集团有限责任公司任职。于2002年7月至2007年2月及2007年2月至2008年7月,刘女士分别担任山东康桥律师事务所及北京天驰君泰律师事务所律师。于2008年8月至2019年10月期间,彼担任山东森信律师事务所合伙人及律师。自2019年11月起,刘女士担任北京天驰君泰(济南)律师事务所合伙人及律师。
  • 黎国鸿先生

    黎国鸿先生,61岁,硕士学历,于2025年2月19日获委任为独立董事,并于同日获调整董事角色为独立非执行董事。 黎先生在企业管治以及财务咨询及管理领域拥有丰富经验。彼于1989年7月至1996年8月期间前后在德勤·关黄陈方会计师行担任会计专员、高级会计师及经理。于1997年4月至2006年12月期间,黎先生就职于冠亚商业集团有限公司(一家于香港联交所上市的公司(股份代号:0104)),彼担任的最后职务为公司秘书兼财务总监。于2007年1月至2013年4月期间,黎先生在德祥地产集团有限公司(一家于香港联交所上市的公司(股份代号:0199))担任财务总监及在德祥企业集团有限公司(一家于香港联交所上市的公司(股份代号:0372))担任首席财务官兼公司秘书。自2013年8月起,黎先生在盛洋投资(控股)有限公司(一家于香港联交所上市的公司(股份代号:0174)) 担任执行董事及董事会投资委员会成员,并自2020年12月起兼任首席执行官。自2017年2月起,彼在桦欣控股有限公司(一家于香港联交所上市的公司(股份代号:1657))担任独立非执行董事。
监事
  • 张红岩女士

    张红岩女士,38岁,硕士学历,于2020年11月7日获委任为监事兼监事会主席。 张女士在技术工程领域拥有丰富经验。彼先后于2012年4月至2020年11月期间担任本公司前身山东太阳成集团tyc33455cc官网材料科技有限公司质量部技术员、技术中心主管、销售技术支持及质量部经理。自2020年11月起,彼担任本公司质量部负责人及监事。
  • 宋建先生

    宋建先生,38岁,于2020年11月7日获委任为监事。 宋先生在碳化硅研发领域拥有丰富经验。彼先后于2011年8月至2020年11月期间担任本公司前身山东太阳成集团tyc33455cc官网材料科技有限公司碳化硅事业部技术员及负责人、技术中心主管及设备动力部经理。自2020年11月起,彼担任本公司工程部负责人及监事。
  • 窦文涛先生

    窦文涛先生,42岁,于2024年8月22日获委任为监事。 窦先生在项目管理及企业管治领域拥有丰富经验。窦先生先后于2010年10月至2020年11月期间担任本公司前身山东太阳成集团tyc33455cc官网材料科技有限公司项目经理、销售部经理、执行董事(代)及董事长助理。自2020年11月起,彼担任本公司董事长助理。
高级管理人员
  • 宗艳民先生

    宗艳民先生,61岁,本科学历,为本公司的董事长、执行董事兼总经理,于2010年11月2日获委任为董事,并于2025年2月19日获调整董事角色为执行董事。 宗先生在半导体材料的技术研发与产业化、工程以及企业管理领域拥有逾35年经验。2010年11月,宗先生创立了本公司前身山东太阳成集团tyc33455cc官网材料科技有限公司,并于2010年11月至2020年11月期间历任董事会主席、执行董事及总经理。自2020年11月起,宗先生一直担任本公司董事长、董事兼总经理。
  • 高超先生

    高超先生,38岁,博士学历,为本公司执行董事兼首席技术官。彼于2019年8月15日获委任为董事,并于2025年2月19日获调整董事角色为执行董事。 高先生于半导体材料技术研发及产业化领域拥有逾十年经验。于2014年7月至2020年11月期间,彼先后在本公司前身山东太阳成集团tyc33455cc官网材料科技有限公司担任研发工程师、研发中心主任、董事兼研发中心主任。自2020年11月起,高先生一直担任本公司的董事兼首席技术官。
  • 钟文庆先生

    钟文庆先生,57岁,自2022年8月起担任本公司董事会秘书。钟先生于2018年12月加入本集团,并先后于2018年12月至2019年8月期间担任本公司首席财务官,于2019年8月至2023年4月期间担任董事兼首席财务官,并于2023年4月至2024年2月期间担任董事。钟先生目前还在本公司的若干子公司中担任董事及╱或监事职务。 钟先生在会计与财务管理、资本市场及企业管治领域拥有逾25年经验。在加入本集团之前,彼于1998年1月至1999年2月期间在通用磨坊(中国)投资有限公司的品食乐大中华区担任财务经理。在美国施乐中国有限公司工作期间,钟先生担任财务总监及市场总监。其后彼于2003年12月至2005年4月在西门子工业软件(上海)有限公司担任财务分析高级经理。钟先生于2005年6月加入沃尔沃建筑设备(中国)有限公司并担任沃尔沃建筑设备公司中国区首席财务官。钟先生于2011年1月至2018年11月期间担任瑞迈国际有限公司总裁。
  • 游樱女士

    游樱女士,50岁,自2024年9月起担任本公司首席财务官。游女士自2024年4月加入本集团起一直担任上海太阳成集团tyc33455cc的财务总监。 游女士在会计与财务管理领域拥有逾25年经验。在加入本集团之前,彼于1998年7月至2004年12月期间在山东干聚有限责任会计师事务所担任审计经理。游女士于2004年12月至2024年3月期间在上汽通用东岳汽车有限公司担任高级财务经理。
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Our mission

To achieve greater profits for shareholders
To provide better products and services for customers
To offer better development platform and benefits for employees
To create greater value and wealth for the society

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Product Consultation

You can contact us through the following ways, or put forward your requirements online

Contact:Sales Department

Tel:0531-85978212
Fax:0531-85978212
E-mail:sales@sicc.cc
Address:No.99 South Tianyue Road, Huaiyin District, Jinan, Shandong.
Online input

Investors

Contact:Board of Directors Office
Tel:0531-69900616
Fax:0531-85978212
E-mail:dmo@sicc.cc
Address:No.99 South Tianyue Road, Huaiyin District, Jinan, Shandong.
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The Semi-insulating SiC substrates have high resistivity and are mainly used for GaN heteroepitaxy.
The RF devices represented by HEMT combine the excellent thermal conductivity of SiC with the high-power Rf output of
GaN in high-frequency range, and are widely applied in the new generation communication field such as the 5G stations.
Semi-insulating Sic substrate materials also exhibit excellent optical properties.
The 12-inch substrates show promising application prospects in optical and wearable electronics, such as AR glasses.

*Please contact our sales for more detailed information.

>Contact us

Specifications

6-inch
  • Diameter 150.0mm+0mm/-0.2mm
  • Surface Orientation {0001}±0.2°
  • Primary Flat Orientation /
  • Secondary Flat Orientation /
  • Primary Flat Length Notch
  • Secondary Flat Length None
  • Notch Orientation <1100>±1.0°
  • Notch Depth None1mm+0.25mm/-0mm from edge
  • Notch Angle 90°+5°/-1°
  • Thickness 500.0um±25.0um
  • Type Semi-insulating

*Please contact our sales for more detailed information.

>Contact us

Specifications

8-inch
  • Diameter 200.0mm+0mm/-0.5mm
  • Surface Orientation {0001}±0.2°
  • Primary Flat Orientation /
  • Secondary Flat Orientation /
  • Primary Flat Length Notch
  • Secondary Flat Length None
  • Notch Orientation <1100>±1.0°
  • Notch Depth None1mm+0.25mm/-0mm from edge
  • Notch Angle 90°+5°/-1°
  • Thickness 500.0um±25.0um
  • Type Semi-insulating

*Please contact our sales for more detailed information.

>Contact us

Specifications

12-inch
  • Diameter 300.0mm+0mm/-0.5mm
  • Surface Orientation {0001}±0.5°
  • Primary Flat Orientation /
  • Secondary Flat Orientation /
  • Primary Flat Length Notch
  • Secondary Flat Length None
  • Notch Orientation <1100>±5.0°
  • Notch Depth None1mm+0.25mm/-0mm from edge
  • Notch Angle 90°+5°/-1°
  • Thickness 750.0um±25.0um
  • Type Semi-insulating

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Production Process of SiC Single Crystal

Silicon carbide single crystal is extremely rare in nature and can only be prepared by artificial synthesis. At present, the industrial production of silicon carbide substrate is mainly based on PVT method. This method needs to sublimate the powder with high temperature and vacuum, and then let the components grow on the seed surface through thermal field control, so as to obtain the silicon carbide crystals. The whole process is completed in an enclosed space, with few effective monitoring and many variables, which requires high process control accuracy.

SICC independently own the whole process from SiC powder to crystal growth and wafering.
1.

SiC Powder

Si+C=SiCPowder
Si and C are synthesized to SiC polycrystalline particles in the ratio of 1:1
SiC powder is the source of crystal growth, and its particle size and purity will directly affect the crystal quality
Especially in the preparation of semi-insulating substrate, the requirement of powder purity is very high
(Impurity content<0.5ppm)
2.

Seed

As the base of crystal growth, it provides the basic lattice structure for crystal growth
It is also the core raw material for crystal quality
3.

Crystal Growth

Physical Vapor Transport(PVT)
The raw materials are heated,
and the sublimated components recrystallize on the seed surface through vapor sublimation and thermal field control
4.

Slicing

SiC is a hard and brittle material whose hardness is second only to diamond
Therefore, it takes long time for slicing, and is easy to crack.
5.

Lapping•Polishing

MP·CMP
Lapping and polishing is to process the substrate surface to nano smooth mirror, which is Epi-ready
The surface state of substrate, such as surface roughness and thickness uniformity, will directly affect the quality of epitaxy and then affect the quality of devices.
6.

Cleaning • Inspection

To remove residual particles and metal impurities in the wafering processes
The final inspection can retain complete quality information such as substrate surface, surface flatness and crystal quality
It helps to trace for the downstream process
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Approaching SiC | The Principle of Silicon Carbide Crystal Growth

    In nature, crystals are everywhere, and their distribution and application are very extensive. Salt, sugar, diamond and snowflakes are all crystals that can be seen in daily life; Besides, crystal materials such as semiconductor crystal, laser crystal, scintillation crystal, and super-hard crystal also play an important role in industry, medical treatment, semiconductor, and many scientific research fields.

    Different crystals have different structures, properties and preparation methods. But their common feature is that the atoms in the crystal are regularly arranged, and the lattice with a specific structure is then formed through periodic stacking in three-dimensional space. Therefore, the appearance of crystal materials usually presents a regular geometric shape.

    Silicon Carbide Single Crystal Substrate Material (hereinafter referred to as SiC Substrate) is also a kind of crystalline materials. It belongs to wide bandgap semiconductor material, and has the advantages of high voltage resistance, high temperature resistance, high frequency, low loss, etc. It is a basic material for preparing high-power electronic devices and microwave RF devices.

The Crystal Structure of SiC

    SiC is a IV-IV compound semiconductor material composed of Carbon and Silicon in a stoichiometric ratio of 1:1, and its hardness is second only to diamond.

    Both Carbon and Silicon atoms have 4 valence electrons, which can form 4 covalent bonds. The basic structural unit of SiC crystal, SiC tetrahedron, arises out of the tetrahedral bonding between Silicon and Carbon atoms. The coordination number of both Silicon and Carbon atoms is 4, i.e. each Carbon atom has 4 Silicon atoms around it and each Silicon atom also has 4 Carbon atoms around it.

    As a crystal material, SiC Substrate also has the characteristic of periodic stacking of atomic layers. The Si-C diatomic layers are stacked along [0001] direction.Due to the small difference in bond energy between layers, different connection modes are easily generated between atomic layers, leading to over 200 SiC polytypes. Common polytypes include 2H-SiC, 3C-SiC, 4H-SiC, 6H-SiC, 15R-SiC, etc. Among them, the stacking sequence in the order of "ABCB" is called the 4H polytype. Although different polytypes of SiC have the same chemical composition, their physical properties, especially the bandgap width, carrier mobility and other characteristics are quite different. And the properties of 4H polytype are more suitable for semiconductor applications.

    The growth parameters such as temperature and pressure significantly influence the stability of 4H-SiC during growth process. Therefore, in order to obtain the single crystal material with high quality and uniformity, the parameters such as growth temperature, growth pressure and growth rate must be precisely controlled during the preparation.

Preparation Method of SiC: Physical Vapor Transport Method (PVT)

    At present, the preparation methods of Silicon Carbide are Physical Vapor Transport Method (PVT),High Temperature Chemical Vapor Deposition Method (HTCVD), and Liquid Phase Method (LPE). And PVT is a mainstream method that is suitable for industrial mass production.

    During PVT growth, SiC seed crystal is placed on the top of crucible while the source material (SiC powder) is placed in the bottom. In an enclosed environment with high temperature and low pressure, SiC powder sublimates, and then transports upward to the space near the seed under the effect of temperature gradient and concentration difference. And it will recrystallize after reaching the supersaturated state. Through this method, the size and polytype of SiC crystal can be controlled.

    However, the PVT method requires maintaining appropriate growth conditions throughout the entire growth process, otherwise it will lead to lattice disorder and form undesired defects. Besides, the SiC crystal growth is completed in an enclosed space with limited monitoring methods and many variables, thus the control of the process is difficult.

The Main Mechanism to Grow Single Crystal: Step Flow Growth

    In the process of growing SiC crystal by PVT method, step flow growth is considered as the main mechanism to form single crystals. The vaporized Si and C atoms will preferentially bond with the atoms on the crystal surface at steps and kinks, where they will nucleate and grow, so that each step flows forward in parallel. When the width between each step on the growth surface is far greater than the diffusion free path of the adsorbed atoms, a large number of adsorbed atoms may agglomerate, and form the two-dimensional island, which will destroy the step flow growth mode, resulting in the formation of other polytypes instead of 4H. Therefore, the adjustment of process parameters aims to control the step structure on the growth surface, so as to prevent the formation of undesired polytypes, and achieve the goal of obtaining 4H single crystal structure, and finally preparing high-quality crystals.

    The growth of the crystal is just the first step to prepare high quality SiC Substrate. Before being used, 4H-SiC ingot needs to go through a series of processes such as slicing, lapping, beveling, polishing, cleaning and inspecting. As a hard but brittle material, SiC single crystal also has high technical requirements for the wafering steps. Any damage generated in each process may have certain heredity, transfers to the next process and finally affect the product quality. Therefore, the efficient wafering technology for SiC Substrate also attracts the attention of the industry.

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P-type SiC substrate materials are mainly used for homoepitaxy and the fabrication of ultrahighvoltage powersemiconductor devices.
They are widely applied in smart grids represented by ultrahighvoltage power transmission,
as well as in rail transit and industrial highpower power supply fields.

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Specifications

6-inch
  • Diameter 150.0mm+0mm/-0.2mm
  • Surface Orientation 4°toward<1120>±0.5°
  • Primary Flat Length 47.5mm±1.5mm
  • Primary Flat Orientation <1120>±5.0°
  • Notch Orientation /
  • Notch Angle /
  • Notch Depth /
  • Thickness 350.0um±25.0um
  • Polytype 4H
  • Type p-type

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Specifications

8-inch
  • Diameter 200.0mm+0mm/-0.2mm
  • Surface Orientation 4°toward<1120>±0.5°
  • Primary Flat Length Notch
  • Primary Flat Orientation /
  • Notch Orientation <1100>±1.0°
  • Notch Angle 90°+5°/-1°
  • Notch Depth 1.0mm+0.25mm/-0mm
  • Thickness 350.0um±25.0um
  • Polytype 4H
  • Type p-type

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Specifications

12-inch
  • Diameter 300.0mm±0.5mm
  • Surface Orientation 4°toward<1120>±0.5°
  • Primary Flat Length Notch
  • Primary Flat Orientation /
  • Notch Orientation <1100>±5.0°
  • Notch Angle 90°+5°/-1°
  • Notch Depth 1.0mm+0.25mm/-0mm
  • Thickness 750.0um±25.0um
  • Polytype 4H
  • Type p-type

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Web content is being updated

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2025
Listed on the Main Board of the Hong Kong Stock Exchange
Global debut of a full product series of 12-inch SiC substrates
Awarded the International Gold Award for Semiconductors (Electronic Materials Category)
2024
World\'s First 12-Inch Silicon Carbide Substrate
Launched Liquid-Phase P-Type Silicon Carbide Substrates
2023
Product delivery started in Shanghai Plant
2022
IPO on the STAR Market (688234)
Successful development of 8-inch products
Awarded as a National Model Enterprise of Intellectual Property
2021
Named National Champion Enterprise of Manufacturing Industry
2020
First Prize of Shandong Provincial Science and Technology Progress
2019
The global market share of S.I. SiC substrate was over 15%
2018
Named the National IP Leading Company
2017
First Prize of Jinan Science and Technology Progress
2015
The new headquarter plant construction completed and operation started
2014
First Prize of Shandong Provincial Technology Invention
2010
Founded with the registered capital of 60 million RMB
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Product Consultation

You can contact us through the following ways, or put forward your requirements online

Contact:Sales Department

Tel:0531-85978212
Fax:0531-85978212
E-mail:sales@sicc.cc
Address:No.99 South Tianyue Road, Huaiyin District, Jinan, Shandong.
Online input

Investors

Contact:Board of Directors Office
Tel:0531-69900616
Fax:0531-85978212
E-mail:dmo@sicc.cc
Address:No.99 South Tianyue Road, Huaiyin District, Jinan, Shandong.
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SICC was founded in 2010. It is a technologicalcompany focusing on the R&D, production and sales of silicon carbide (SiC)substrate material.

With the business philosophy of Technology ·Quality · Sustainability, SICC attaches importance to product and servicequality, takes meeting customer needs and helping customers solve problems asits work orientation. SICC actively expands the market and pursues sustainablebusiness development while mastering the process technology independently.

The SiC Single Crystal Substrate is a widebandgap semiconductor material. Compared with traditional materials, it hasbetter physical properties and can effectively improve the power density andoverall performance of devices. It can be widely used in fields of powerelectronics and microwave electronics.

But what behind the superior physicalproperties are sophisticated and complex preparation processes. The SiC signalcrystal grows in an enclosed environment with high temperature and low pressure.Any slight change in the environment may cause lattice disorder, which willaffect the crystal quality.

Relying on the experience of industrialization andthe R&D team, SICC keeps paying attention to technology leading and qualityimproving, and insists on continuous innovation. SICC will build integratedsolutions to improve service and product, and strives to become aninternational famous company of semiconductor materials.

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Product consultation

Contact: Sales Department
Tel: 0531-85978212
Fax: 0531-85978212
Email: sales@sicc.cc
Address: No. 99, Tianyue South Road, Huaiyin District, Jinan City, Shandong Province

Investor Relations

Contact: Office of the Board of Directors
Tel: 0531-69900616
Fax: 0531-85978212
Email: dmo@sicc.cc
Address: No. 99, Tianyue South Road, Huaiyin District, Jinan City, Shandong Province

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N-type SiC substrate materials are primarily used for homoepitaxial growth in the fabrication of power semiconductor devices.
They are widely applied in new energy sectors such as electric vehicles, as well as in photovoltaic and wind power generation.
Currently, SICC\'s 6-inch and 8-inch products are consistently delivered to global customers for volume production, while also
possessing the capability to produce 12-inchsubstrate products.

*Please contact our sales for more detailed information.

>Contact us

Specifications

6-inch
  • Diameter 150.0mm+0mm/-0.2mm
  • Surface Orientation 4°toward<1120>±0.5°
  • Primary Flat Length 47.5 mm ±1.5 mm
  • Primary Flat Orientation <1120>±1.0°
  • Notch Orientation /
  • Notch Angle /
  • Notch Depth /
  • Secondary Flat N/A
  • Thickness 350.0um士25.0um
  • Polytype 4H
  • Type n-type

*Please contact our sales for more detailed information.

>Contact us

Specifications

8-inch
  • Diameter 200.0mm+0mm/-0.5mm
  • Surface Orientation 4°toward<1120>±0.5°
  • Primary Flat Length Notch
  • Primary Flat Orientation /
  • Notch Orientation <1100>±1.0°
  • Notch Angle 90°+5°/-1°
  • Notch Depth 1.0mm+0.25mm/-0mm
  • Secondary Flat N/A
  • Thickness 500.0um士25.0um
  • Polytype 4H
  • Type n-type

*Please contact our sales for more detailed information.

>Contact us

Specifications

12-inch
  • Diameter 300.0mm+0mm/-0.5mm
  • Surface Orientation 4°toward<1120>±0.5°
  • Primary Flat Length Notch
  • Primary Flat Orientation /
  • Notch Orientation <1100>±5.0°
  • Notch Angle 90°+5°/-1°
  • Notch Depth 1.0mm+0.25mm/-0mm
  • Secondary Flat N/A
  • Thickness 750.0um士25.0um
  • Polytype 4H
  • Type n-type

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What is Silicon Carbide

Compared with traditional materials, silicon carbide has excellent physical properties,
which can reduce weight and improve efficiency for discrete devices, modules and even systems

SiC

Si(silicon)+C(carbon)=SiC
Silicon carbide is a group IV - IV compound semiconductor material formed by C and Si elements in the ratio of 1:1,
and its hardness is second only to diamond.
This semiconductor material has great development potential, but is hard and brittle.
The preparation process is complex and the processing is difficult.

SiC Features

Excellent physical properties
Wide bandgap (High temperature resistance)1
High critical breakdown field(High voltage resistance2
High thermal conductivity(Heat dissipation)3
Saturated electron drift velocity(High switching speed)4
4H-SiC Si GaAs GaN
Wide bandgap(eV)1 3.26 1.12 1.42 3.42
High critical breakdown field(MV/cm)2 2.8 0.3 0.4 3
High thermal conductivity(W/cmK)3 4.9 1.5 0.46 1.3
Saturated electron drift velocity(1E7 cm/s)4 2.7 1 2 2.7
1.A wider bandgap can ensure that electrons are not easy to transit and intrinsic excitation is weak at high temperature. Thus, it can withstand higher operating temperature.
The bandgap width of silicon carbide is three times that of silicon, and its theoretical working temperature can reach more than 400 ℃.

2.Critical breakdown field strength refers to the electric field strength in electric breakdown. Once this value is exceeded, the material will lose its insulation performance.
It determines the voltage resistance of a material.
The critical field strength of silicon carbide is about 10 times that of Si, which can withstand higher voltage and is more suitable for high voltage devices.

3.Heat is one of the main reasons affecting the lifetime of devices.
The thermal conductivity represents the material\'s ability to conduct heat.
The high thermal conductivity of silicon carbide can effectively conduct heat, reduce the device temperature and maintain its normal operation. 

4.The saturated electron drift velocity refers to the maximum directional moving speed of electrons in semiconductor materials.
It determines the switching frequency of devices.
The saturated electron drift velocity of silicon carbide is twice that of silicon, which can miniaturize the device and improve efficiency.

SiC Applications

Power Electronics Devices

SiC power devices have unique advantages such as high voltage, high current, high temperature, high frequency and low loss, which will greatly improve the energy conversion efficiency of existing silicon based power devices and have a significant and far-reaching impact on the field of efficient energy conversion.
The main application fields are electric vehicles, charging piles, photovoltaic new energy, rail transit, smart grid, etc.

Microwave Communication

Silicon carbide based gallium nitride RF devices have been successfully applied in many fields, mainly in wireless communication infrastructure.
Silicon carbide as substrate gallium nitride RF devices have both good thermal conductivity of silicon carbide and advantages of high-power RF output of gallium nitride in high frequency band, which can provide the power and efficiency required by the next generation of high frequency telecommunication network and become the mainstream choice of 5G base station power amplifier.
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Directors, Supervisors and Senior Management
董事
  • 宗艳民先生

    宗艳民先生,61岁,本科学历,为本公司的董事长、执行董事兼总经理,于2010年11月2日获委任为董事,并于2025年2月19日获调整董事角色为执行董事。
    宗先生在半导体材料的技术研发与产业化、工程以及企业管理领域拥有逾35年经验。2010年11月,宗先生创立了本公司前身山东太阳成集团tyc33455cc官网材料科技有限公司,并于2010年11月至2020年11月期间历任董事会主席、执行董事及总经理。自2020年11月起,宗先生一直担任本公司董事长、董事兼总经理。
  • 高超先生

    高超先生,38岁,博士学历,为本公司执行董事兼首席技术官。彼于2019年8月15日获委任为董事,并于2025年2月19日获调整董事角色为执行董事。
    高先生于半导体材料技术研发及产业化领域拥有逾十年经验。于2014年7月至2020年11月期间,彼先后在本公司前身山东太阳成集团tyc33455cc官网材料科技有限公司担任研发工程师、研发中心主任、董事兼研发中心主任。自2020年11月起,高先生一直担任本公司的董事兼首席技术官。
  • 王俊国先生

    王俊国先生,47岁,于2025年7月2日获委任为董事,并于同日获调整董事角色为执行董事。
    王先生在财务管理领域拥有丰富经验。彼于2016年8月至2020年11月期间担任本公司前身山东太阳成集团tyc33455cc官网材料科技有限公司财务总监,并自2020年11月起担任本公司财务总监,并自2024年8月起担任我们的证券事务代表。
  • 邱宇峰先生

    邱宇峰先生,65岁,硕士学历,于2024年2月29日获委任为董事,并于2025年2月19日获调整董事角色为非执行董事。邱先生于2020年11月至2021年1月期间担任本公司独立董事。
    邱先生在电力及半导体技术研发领域拥有逾30年经验。于1994年6月至1999年11月期间,彼先后在中国电力科学研究院电力系统研究所担任继电保护室主任及副所长;于1999年11月至2006年12月期间,彼在中国电力科学研究院输配电及节电 技术国家工程研究中心担任常务副主任;于2006年12月至2012年2月期间,彼在中国电力科学研究院担任副院长。邱先生于2012年2月至2020年2月期间,先后在全球能源互联网研究院有限公司(前称国网智能电网研究院)担任多个职位,包括副院长、院长、顾问及其他职位。邱先生现任厦门大学讲座教授,以及自2022年4月起担任博测锐创半导体科技(苏州)有限公司董事会主席兼总经理,自2022年5月起担任北京博测半导体科技有限公司执行董事兼总经理,自2023年6月起担任思源电气股份有限公司(一家于深圳证券交易所上市的公司(股票代码:002028))的独立董事,并自2023年9月起担任北京顺德盛企业管理合伙企业(有限合伙)的执行事务合伙人。
  • 李婉越女士

    李婉越女士,54岁,硕士学历,于2025年2月19日获委任为董事,并于同日获调整董事角色为非执行董事。
    李女士在会计及融资领域拥有30年经验。彼于1994年7月至1999年7月期间任职于北京新型建筑材料总厂,离职前为助理会计师。 于1999年10月至2020年12月期间,李女士先后在北新建材(集团)有限公司担任多个职位,包括财务部会计、财务部经理及其他职位。自2022年12月起,彼一直担任中建材联合投资有限公司的总会计师。
  • 方伟先生

    方伟先生,50岁,硕士学历,于2024年2月29日获委任为董事,并于2025年2月19日获重新委任为非执行董事。
    方先生在无线产品工程及企业管理领域拥有逾25年经验。自1999年2月起,彼任职于一家从事ICT(信息与通信)基础设施和智能终端提供商业务的全球性企业,现任第五轨道外派董事。自2023年12月起,彼亦担任苏州东微半导体股份有限公司(一家于上海证券交易所上市的公司(股票代码:688261))董事。
  • 李洪辉先生

    李洪辉先生,61岁,博士学历,于2024年2月29日获委任为独立董事,并于2025年2月19日获调整董事角色为独立非执行董事。
    李先生在财务管理领域拥有丰富的经验。彼任职于中华人民共和国财政部至2014年8月,最后职位为投资评审中心副主任。彼亦于2014年8月至2018年7月期间担任中国信达资产管理股份有限公司(一家于香港联交所上市的公司(股份代号:1359))董事。李先生于2018年担任中华人民共和国财政部预算评审中心副主任。彼亦担任中海外科技开发有限公司董事长至2019年11月。自2022年6月起至2024年1月期间,彼担任北京中财宝信管理咨询有限公司执行董事。李先生自2023年6月起,担任中润辉铭(海南)投资有限公司执行董事、总经理兼财务总监;自2023年10月起, 担任华大卓越(北京)投资管理有限公司(前称北京百家信诚投资管理有限公司)执行董事、总经理兼财务总监;自2024年8月起,担任吉林省北药科技有限公司总经理;并自2024年10月起,担任辽宁北药金吉科技发展有限公司监事。
  • 刘华女士

    刘华女士,56岁,本科学历,于2024年2月29日获委任为独立董事,并于2025年2月19日获调整董事角色为独立非执行董事。 刘女士在法律、监管及合规治理领域拥有丰富经验。彼于1992年7月至2002年3月期间在山东三联集团有限责任公司任职。于2002年7月至2007年2月及2007年2月至2008年7月,刘女士分别担任山东康桥律师事务所及北京天驰君泰律师事务所律师。于2008年8月至2019年10月期间,彼担任山东森信律师事务所合伙人及律师。自2019年11月起,刘女士担任北京天驰君泰(济南)律师事务所合伙人及律师。
  • 黎国鸿先生

    黎国鸿先生,61岁,硕士学历,于2025年2月19日获委任为独立董事,并于同日获调整董事角色为独立非执行董事。 黎先生在企业管治以及财务咨询及管理领域拥有丰富经验。彼于1989年7月至1996年8月期间前后在德勤·关黄陈方会计师行担任会计专员、高级会计师及经理。于1997年4月至2006年12月期间,黎先生就职于冠亚商业集团有限公司(一家于香港联交所上市的公司(股份代号:0104)),彼担任的最后职务为公司秘书兼财务总监。于2007年1月至2013年4月期间,黎先生在德祥地产集团有限公司(一家于香港联交所上市的公司(股份代号:0199))担任财务总监及在德祥企业集团有限公司(一家于香港联交所上市的公司(股份代号:0372))担任首席财务官兼公司秘书。自2013年8月起,黎先生在盛洋投资(控股)有限公司(一家于香港联交所上市的公司(股份代号:0174)) 担任执行董事及董事会投资委员会成员,并自2020年12月起兼任首席执行官。自2017年2月起,彼在桦欣控股有限公司(一家于香港联交所上市的公司(股份代号:1657))担任独立非执行董事。
监事
  • 张红岩女士

    张红岩女士,38岁,硕士学历,于2020年11月7日获委任为监事兼监事会主席。 张女士在技术工程领域拥有丰富经验。彼先后于2012年4月至2020年11月期间担任本公司前身山东太阳成集团tyc33455cc官网材料科技有限公司质量部技术员、技术中心主管、销售技术支持及质量部经理。自2020年11月起,彼担任本公司质量部负责人及监事。
  • 宋建先生

    宋建先生,38岁,于2020年11月7日获委任为监事。 宋先生在碳化硅研发领域拥有丰富经验。彼先后于2011年8月至2020年11月期间担任本公司前身山东太阳成集团tyc33455cc官网材料科技有限公司碳化硅事业部技术员及负责人、技术中心主管及设备动力部经理。自2020年11月起,彼担任本公司工程部负责人及监事。
  • 窦文涛先生

    窦文涛先生,42岁,于2024年8月22日获委任为监事。 窦先生在项目管理及企业管治领域拥有丰富经验。窦先生先后于2010年10月至2020年11月期间担任本公司前身山东太阳成集团tyc33455cc官网材料科技有限公司项目经理、销售部经理、执行董事(代)及董事长助理。自2020年11月起,彼担任本公司董事长助理。
高级管理人员
  • 宗艳民先生

    宗艳民先生,61岁,本科学历,为本公司的董事长、执行董事兼总经理,于2010年11月2日获委任为董事,并于2025年2月19日获调整董事角色为执行董事。 宗先生在半导体材料的技术研发与产业化、工程以及企业管理领域拥有逾35年经验。2010年11月,宗先生创立了本公司前身山东太阳成集团tyc33455cc官网材料科技有限公司,并于2010年11月至2020年11月期间历任董事会主席、执行董事及总经理。自2020年11月起,宗先生一直担任本公司董事长、董事兼总经理。
  • 高超先生

    高超先生,38岁,博士学历,为本公司执行董事兼首席技术官。彼于2019年8月15日获委任为董事,并于2025年2月19日获调整董事角色为执行董事。 高先生于半导体材料技术研发及产业化领域拥有逾十年经验。于2014年7月至2020年11月期间,彼先后在本公司前身山东太阳成集团tyc33455cc官网材料科技有限公司担任研发工程师、研发中心主任、董事兼研发中心主任。自2020年11月起,高先生一直担任本公司的董事兼首席技术官。
  • 钟文庆先生

    钟文庆先生,57岁,自2022年8月起担任本公司董事会秘书。钟先生于2018年12月加入本集团,并先后于2018年12月至2019年8月期间担任本公司首席财务官,于2019年8月至2023年4月期间担任董事兼首席财务官,并于2023年4月至2024年2月期间担任董事。钟先生目前还在本公司的若干子公司中担任董事及╱或监事职务。 钟先生在会计与财务管理、资本市场及企业管治领域拥有逾25年经验。在加入本集团之前,彼于1998年1月至1999年2月期间在通用磨坊(中国)投资有限公司的品食乐大中华区担任财务经理。在美国施乐中国有限公司工作期间,钟先生担任财务总监及市场总监。其后彼于2003年12月至2005年4月在西门子工业软件(上海)有限公司担任财务分析高级经理。钟先生于2005年6月加入沃尔沃建筑设备(中国)有限公司并担任沃尔沃建筑设备公司中国区首席财务官。钟先生于2011年1月至2018年11月期间担任瑞迈国际有限公司总裁。
  • 游樱女士

    游樱女士,50岁,自2024年9月起担任本公司首席财务官。游女士自2024年4月加入本集团起一直担任上海太阳成集团tyc33455cc的财务总监。 游女士在会计与财务管理领域拥有逾25年经验。在加入本集团之前,彼于1998年7月至2004年12月期间在山东干聚有限责任会计师事务所担任审计经理。游女士于2004年12月至2024年3月期间在上汽通用东岳汽车有限公司担任高级财务经理。
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Our mission

To achieve greater profits for shareholders
To provide better products and services for customers
To offer better development platform and benefits for employees
To create greater value and wealth for the society

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Product Consultation

You can contact us through the following ways, or put forward your requirements online

Contact:Sales Department

Tel:0531-85978212
Fax:0531-85978212
E-mail:sales@sicc.cc
Address:No.99 South Tianyue Road, Huaiyin District, Jinan, Shandong.
Online input

Investors

Contact:Board of Directors Office
Tel:0531-69900616
Fax:0531-85978212
E-mail:dmo@sicc.cc
Address:No.99 South Tianyue Road, Huaiyin District, Jinan, Shandong.
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The Semi-insulating SiC substrates have high resistivity and are mainly used for GaN heteroepitaxy.
The RF devices represented by HEMT combine the excellent thermal conductivity of SiC with the high-power Rf output of
GaN in high-frequency range, and are widely applied in the new generation communication field such as the 5G stations.
Semi-insulating Sic substrate materials also exhibit excellent optical properties.
The 12-inch substrates show promising application prospects in optical and wearable electronics, such as AR glasses.

*Please contact our sales for more detailed information.

>Contact us

Specifications

6-inch
  • Diameter 150.0mm+0mm/-0.2mm
  • Surface Orientation {0001}±0.2°
  • Primary Flat Orientation /
  • Secondary Flat Orientation /
  • Primary Flat Length Notch
  • Secondary Flat Length None
  • Notch Orientation <1100>±1.0°
  • Notch Depth None1mm+0.25mm/-0mm from edge
  • Notch Angle 90°+5°/-1°
  • Thickness 500.0um±25.0um
  • Type Semi-insulating

*Please contact our sales for more detailed information.

>Contact us

Specifications

8-inch
  • Diameter 200.0mm+0mm/-0.5mm
  • Surface Orientation {0001}±0.2°
  • Primary Flat Orientation /
  • Secondary Flat Orientation /
  • Primary Flat Length Notch
  • Secondary Flat Length None
  • Notch Orientation <1100>±1.0°
  • Notch Depth None1mm+0.25mm/-0mm from edge
  • Notch Angle 90°+5°/-1°
  • Thickness 500.0um±25.0um
  • Type Semi-insulating

*Please contact our sales for more detailed information.

>Contact us

Specifications

12-inch
  • Diameter 300.0mm+0mm/-0.5mm
  • Surface Orientation {0001}±0.5°
  • Primary Flat Orientation /
  • Secondary Flat Orientation /
  • Primary Flat Length Notch
  • Secondary Flat Length None
  • Notch Orientation <1100>±5.0°
  • Notch Depth None1mm+0.25mm/-0mm from edge
  • Notch Angle 90°+5°/-1°
  • Thickness 750.0um±25.0um
  • Type Semi-insulating

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Production Process of SiC Single Crystal

Silicon carbide single crystal is extremely rare in nature and can only be prepared by artificial synthesis. At present, the industrial production of silicon carbide substrate is mainly based on PVT method. This method needs to sublimate the powder with high temperature and vacuum, and then let the components grow on the seed surface through thermal field control, so as to obtain the silicon carbide crystals. The whole process is completed in an enclosed space, with few effective monitoring and many variables, which requires high process control accuracy.

SICC independently own the whole process from SiC powder to crystal growth and wafering.
1.

SiC Powder

Si+C=SiCPowder
Si and C are synthesized to SiC polycrystalline particles in the ratio of 1:1
SiC powder is the source of crystal growth, and its particle size and purity will directly affect the crystal quality
Especially in the preparation of semi-insulating substrate, the requirement of powder purity is very high
(Impurity content<0.5ppm)
2.

Seed

As the base of crystal growth, it provides the basic lattice structure for crystal growth
It is also the core raw material for crystal quality
3.

Crystal Growth

Physical Vapor Transport(PVT)
The raw materials are heated,
and the sublimated components recrystallize on the seed surface through vapor sublimation and thermal field control
4.

Slicing

SiC is a hard and brittle material whose hardness is second only to diamond
Therefore, it takes long time for slicing, and is easy to crack.
5.

Lapping•Polishing

MP·CMP
Lapping and polishing is to process the substrate surface to nano smooth mirror, which is Epi-ready
The surface state of substrate, such as surface roughness and thickness uniformity, will directly affect the quality of epitaxy and then affect the quality of devices.
6.

Cleaning • Inspection

To remove residual particles and metal impurities in the wafering processes
The final inspection can retain complete quality information such as substrate surface, surface flatness and crystal quality
It helps to trace for the downstream process
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Approaching SiC | The Principle of Silicon Carbide Crystal Growth

    In nature, crystals are everywhere, and their distribution and application are very extensive. Salt, sugar, diamond and snowflakes are all crystals that can be seen in daily life; Besides, crystal materials such as semiconductor crystal, laser crystal, scintillation crystal, and super-hard crystal also play an important role in industry, medical treatment, semiconductor, and many scientific research fields.

    Different crystals have different structures, properties and preparation methods. But their common feature is that the atoms in the crystal are regularly arranged, and the lattice with a specific structure is then formed through periodic stacking in three-dimensional space. Therefore, the appearance of crystal materials usually presents a regular geometric shape.

    Silicon Carbide Single Crystal Substrate Material (hereinafter referred to as SiC Substrate) is also a kind of crystalline materials. It belongs to wide bandgap semiconductor material, and has the advantages of high voltage resistance, high temperature resistance, high frequency, low loss, etc. It is a basic material for preparing high-power electronic devices and microwave RF devices.

The Crystal Structure of SiC

    SiC is a IV-IV compound semiconductor material composed of Carbon and Silicon in a stoichiometric ratio of 1:1, and its hardness is second only to diamond.

    Both Carbon and Silicon atoms have 4 valence electrons, which can form 4 covalent bonds. The basic structural unit of SiC crystal, SiC tetrahedron, arises out of the tetrahedral bonding between Silicon and Carbon atoms. The coordination number of both Silicon and Carbon atoms is 4, i.e. each Carbon atom has 4 Silicon atoms around it and each Silicon atom also has 4 Carbon atoms around it.

    As a crystal material, SiC Substrate also has the characteristic of periodic stacking of atomic layers. The Si-C diatomic layers are stacked along [0001] direction.Due to the small difference in bond energy between layers, different connection modes are easily generated between atomic layers, leading to over 200 SiC polytypes. Common polytypes include 2H-SiC, 3C-SiC, 4H-SiC, 6H-SiC, 15R-SiC, etc. Among them, the stacking sequence in the order of "ABCB" is called the 4H polytype. Although different polytypes of SiC have the same chemical composition, their physical properties, especially the bandgap width, carrier mobility and other characteristics are quite different. And the properties of 4H polytype are more suitable for semiconductor applications.

    The growth parameters such as temperature and pressure significantly influence the stability of 4H-SiC during growth process. Therefore, in order to obtain the single crystal material with high quality and uniformity, the parameters such as growth temperature, growth pressure and growth rate must be precisely controlled during the preparation.

Preparation Method of SiC: Physical Vapor Transport Method (PVT)

    At present, the preparation methods of Silicon Carbide are Physical Vapor Transport Method (PVT),High Temperature Chemical Vapor Deposition Method (HTCVD), and Liquid Phase Method (LPE). And PVT is a mainstream method that is suitable for industrial mass production.

    During PVT growth, SiC seed crystal is placed on the top of crucible while the source material (SiC powder) is placed in the bottom. In an enclosed environment with high temperature and low pressure, SiC powder sublimates, and then transports upward to the space near the seed under the effect of temperature gradient and concentration difference. And it will recrystallize after reaching the supersaturated state. Through this method, the size and polytype of SiC crystal can be controlled.

    However, the PVT method requires maintaining appropriate growth conditions throughout the entire growth process, otherwise it will lead to lattice disorder and form undesired defects. Besides, the SiC crystal growth is completed in an enclosed space with limited monitoring methods and many variables, thus the control of the process is difficult.

The Main Mechanism to Grow Single Crystal: Step Flow Growth

    In the process of growing SiC crystal by PVT method, step flow growth is considered as the main mechanism to form single crystals. The vaporized Si and C atoms will preferentially bond with the atoms on the crystal surface at steps and kinks, where they will nucleate and grow, so that each step flows forward in parallel. When the width between each step on the growth surface is far greater than the diffusion free path of the adsorbed atoms, a large number of adsorbed atoms may agglomerate, and form the two-dimensional island, which will destroy the step flow growth mode, resulting in the formation of other polytypes instead of 4H. Therefore, the adjustment of process parameters aims to control the step structure on the growth surface, so as to prevent the formation of undesired polytypes, and achieve the goal of obtaining 4H single crystal structure, and finally preparing high-quality crystals.

    The growth of the crystal is just the first step to prepare high quality SiC Substrate. Before being used, 4H-SiC ingot needs to go through a series of processes such as slicing, lapping, beveling, polishing, cleaning and inspecting. As a hard but brittle material, SiC single crystal also has high technical requirements for the wafering steps. Any damage generated in each process may have certain heredity, transfers to the next process and finally affect the product quality. Therefore, the efficient wafering technology for SiC Substrate also attracts the attention of the industry.

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P-type SiC substrate materials are mainly used for homoepitaxy and the fabrication of ultrahighvoltage powersemiconductor devices.
They are widely applied in smart grids represented by ultrahighvoltage power transmission,
as well as in rail transit and industrial highpower power supply fields.

*Please contact our sales for more detailed information.

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Specifications

6-inch
  • Diameter 150.0mm+0mm/-0.2mm
  • Surface Orientation 4°toward<1120>±0.5°
  • Primary Flat Length 47.5mm±1.5mm
  • Primary Flat Orientation <1120>±5.0°
  • Notch Orientation /
  • Notch Angle /
  • Notch Depth /
  • Thickness 350.0um±25.0um
  • Polytype 4H
  • Type p-type

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Specifications

8-inch
  • Diameter 200.0mm+0mm/-0.2mm
  • Surface Orientation 4°toward<1120>±0.5°
  • Primary Flat Length Notch
  • Primary Flat Orientation /
  • Notch Orientation <1100>±1.0°
  • Notch Angle 90°+5°/-1°
  • Notch Depth 1.0mm+0.25mm/-0mm
  • Thickness 350.0um±25.0um
  • Polytype 4H
  • Type p-type

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Specifications

12-inch
  • Diameter 300.0mm±0.5mm
  • Surface Orientation 4°toward<1120>±0.5°
  • Primary Flat Length Notch
  • Primary Flat Orientation /
  • Notch Orientation <1100>±5.0°
  • Notch Angle 90°+5°/-1°
  • Notch Depth 1.0mm+0.25mm/-0mm
  • Thickness 750.0um±25.0um
  • Polytype 4H
  • Type p-type

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Web content is being updated

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2025
Listed on the Main Board of the Hong Kong Stock Exchange
Global debut of a full product series of 12-inch SiC substrates
Awarded the International Gold Award for Semiconductors (Electronic Materials Category)
2024
World\'s First 12-Inch Silicon Carbide Substrate
Launched Liquid-Phase P-Type Silicon Carbide Substrates
2023
Product delivery started in Shanghai Plant
2022
IPO on the STAR Market (688234)
Successful development of 8-inch products
Awarded as a National Model Enterprise of Intellectual Property
2021
Named National Champion Enterprise of Manufacturing Industry
2020
First Prize of Shandong Provincial Science and Technology Progress
2019
The global market share of S.I. SiC substrate was over 15%
2018
Named the National IP Leading Company
2017
First Prize of Jinan Science and Technology Progress
2015
The new headquarter plant construction completed and operation started
2014
First Prize of Shandong Provincial Technology Invention
2010
Founded with the registered capital of 60 million RMB
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Product Consultation

You can contact us through the following ways, or put forward your requirements online

Contact:Sales Department

Tel:0531-85978212
Fax:0531-85978212
E-mail:sales@sicc.cc
Address:No.99 South Tianyue Road, Huaiyin District, Jinan, Shandong.
Online input

Investors

Contact:Board of Directors Office
Tel:0531-69900616
Fax:0531-85978212
E-mail:dmo@sicc.cc
Address:No.99 South Tianyue Road, Huaiyin District, Jinan, Shandong.
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SICC was founded in 2010. It is a technologicalcompany focusing on the R&D, production and sales of silicon carbide (SiC)substrate material.

With the business philosophy of Technology ·Quality · Sustainability, SICC attaches importance to product and servicequality, takes meeting customer needs and helping customers solve problems asits work orientation. SICC actively expands the market and pursues sustainablebusiness development while mastering the process technology independently.

The SiC Single Crystal Substrate is a widebandgap semiconductor material. Compared with traditional materials, it hasbetter physical properties and can effectively improve the power density andoverall performance of devices. It can be widely used in fields of powerelectronics and microwave electronics.

But what behind the superior physicalproperties are sophisticated and complex preparation processes. The SiC signalcrystal grows in an enclosed environment with high temperature and low pressure.Any slight change in the environment may cause lattice disorder, which willaffect the crystal quality.

Relying on the experience of industrialization andthe R&D team, SICC keeps paying attention to technology leading and qualityimproving, and insists on continuous innovation. SICC will build integratedsolutions to improve service and product, and strives to become aninternational famous company of semiconductor materials.

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Product consultation

Contact: Sales Department
Tel: 0531-85978212
Fax: 0531-85978212
Email: sales@sicc.cc
Address: No. 99, Tianyue South Road, Huaiyin District, Jinan City, Shandong Province

Investor Relations

Contact: Office of the Board of Directors
Tel: 0531-69900616
Fax: 0531-85978212
Email: dmo@sicc.cc
Address: No. 99, Tianyue South Road, Huaiyin District, Jinan City, Shandong Province

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N-type SiC substrate materials are primarily used for homoepitaxial growth in the fabrication of power semiconductor devices.
They are widely applied in new energy sectors such as electric vehicles, as well as in photovoltaic and wind power generation.
Currently, SICC\'s 6-inch and 8-inch products are consistently delivered to global customers for volume production, while also
possessing the capability to produce 12-inchsubstrate products.

*Please contact our sales for more detailed information.

>Contact us

Specifications

6-inch
  • Diameter 150.0mm+0mm/-0.2mm
  • Surface Orientation 4°toward<1120>±0.5°
  • Primary Flat Length 47.5 mm ±1.5 mm
  • Primary Flat Orientation <1120>±1.0°
  • Notch Orientation /
  • Notch Angle /
  • Notch Depth /
  • Secondary Flat N/A
  • Thickness 350.0um士25.0um
  • Polytype 4H
  • Type n-type

*Please contact our sales for more detailed information.

>Contact us

Specifications

8-inch
  • Diameter 200.0mm+0mm/-0.5mm
  • Surface Orientation 4°toward<1120>±0.5°
  • Primary Flat Length Notch
  • Primary Flat Orientation /
  • Notch Orientation <1100>±1.0°
  • Notch Angle 90°+5°/-1°
  • Notch Depth 1.0mm+0.25mm/-0mm
  • Secondary Flat N/A
  • Thickness 500.0um士25.0um
  • Polytype 4H
  • Type n-type

*Please contact our sales for more detailed information.

>Contact us

Specifications

12-inch
  • Diameter 300.0mm+0mm/-0.5mm
  • Surface Orientation 4°toward<1120>±0.5°
  • Primary Flat Length Notch
  • Primary Flat Orientation /
  • Notch Orientation <1100>±5.0°
  • Notch Angle 90°+5°/-1°
  • Notch Depth 1.0mm+0.25mm/-0mm
  • Secondary Flat N/A
  • Thickness 750.0um士25.0um
  • Polytype 4H
  • Type n-type

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What is Silicon Carbide

Compared with traditional materials, silicon carbide has excellent physical properties,
which can reduce weight and improve efficiency for discrete devices, modules and even systems

SiC

Si(silicon)+C(carbon)=SiC
Silicon carbide is a group IV - IV compound semiconductor material formed by C and Si elements in the ratio of 1:1,
and its hardness is second only to diamond.
This semiconductor material has great development potential, but is hard and brittle.
The preparation process is complex and the processing is difficult.

SiC Features

Excellent physical properties
Wide bandgap (High temperature resistance)1
High critical breakdown field(High voltage resistance2
High thermal conductivity(Heat dissipation)3
Saturated electron drift velocity(High switching speed)4
4H-SiC Si GaAs GaN
Wide bandgap(eV)1 3.26 1.12 1.42 3.42
High critical breakdown field(MV/cm)2 2.8 0.3 0.4 3
High thermal conductivity(W/cmK)3 4.9 1.5 0.46 1.3
Saturated electron drift velocity(1E7 cm/s)4 2.7 1 2 2.7
1.A wider bandgap can ensure that electrons are not easy to transit and intrinsic excitation is weak at high temperature. Thus, it can withstand higher operating temperature.
The bandgap width of silicon carbide is three times that of silicon, and its theoretical working temperature can reach more than 400 ℃.

2.Critical breakdown field strength refers to the electric field strength in electric breakdown. Once this value is exceeded, the material will lose its insulation performance.
It determines the voltage resistance of a material.
The critical field strength of silicon carbide is about 10 times that of Si, which can withstand higher voltage and is more suitable for high voltage devices.

3.Heat is one of the main reasons affecting the lifetime of devices.
The thermal conductivity represents the material\'s ability to conduct heat.
The high thermal conductivity of silicon carbide can effectively conduct heat, reduce the device temperature and maintain its normal operation. 

4.The saturated electron drift velocity refers to the maximum directional moving speed of electrons in semiconductor materials.
It determines the switching frequency of devices.
The saturated electron drift velocity of silicon carbide is twice that of silicon, which can miniaturize the device and improve efficiency.

SiC Applications

Power Electronics Devices

SiC power devices have unique advantages such as high voltage, high current, high temperature, high frequency and low loss, which will greatly improve the energy conversion efficiency of existing silicon based power devices and have a significant and far-reaching impact on the field of efficient energy conversion.
The main application fields are electric vehicles, charging piles, photovoltaic new energy, rail transit, smart grid, etc.

Microwave Communication

Silicon carbide based gallium nitride RF devices have been successfully applied in many fields, mainly in wireless communication infrastructure.
Silicon carbide as substrate gallium nitride RF devices have both good thermal conductivity of silicon carbide and advantages of high-power RF output of gallium nitride in high frequency band, which can provide the power and efficiency required by the next generation of high frequency telecommunication network and become the mainstream choice of 5G base station power amplifier.
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Directors, Supervisors and Senior Management
董事
  • 宗艳民先生

    宗艳民先生,61岁,本科学历,为本公司的董事长、执行董事兼总经理,于2010年11月2日获委任为董事,并于2025年2月19日获调整董事角色为执行董事。
    宗先生在半导体材料的技术研发与产业化、工程以及企业管理领域拥有逾35年经验。2010年11月,宗先生创立了本公司前身山东太阳成集团tyc33455cc官网材料科技有限公司,并于2010年11月至2020年11月期间历任董事会主席、执行董事及总经理。自2020年11月起,宗先生一直担任本公司董事长、董事兼总经理。
  • 高超先生

    高超先生,38岁,博士学历,为本公司执行董事兼首席技术官。彼于2019年8月15日获委任为董事,并于2025年2月19日获调整董事角色为执行董事。
    高先生于半导体材料技术研发及产业化领域拥有逾十年经验。于2014年7月至2020年11月期间,彼先后在本公司前身山东太阳成集团tyc33455cc官网材料科技有限公司担任研发工程师、研发中心主任、董事兼研发中心主任。自2020年11月起,高先生一直担任本公司的董事兼首席技术官。
  • 王俊国先生

    王俊国先生,47岁,于2025年7月2日获委任为董事,并于同日获调整董事角色为执行董事。
    王先生在财务管理领域拥有丰富经验。彼于2016年8月至2020年11月期间担任本公司前身山东太阳成集团tyc33455cc官网材料科技有限公司财务总监,并自2020年11月起担任本公司财务总监,并自2024年8月起担任我们的证券事务代表。
  • 邱宇峰先生

    邱宇峰先生,65岁,硕士学历,于2024年2月29日获委任为董事,并于2025年2月19日获调整董事角色为非执行董事。邱先生于2020年11月至2021年1月期间担任本公司独立董事。
    邱先生在电力及半导体技术研发领域拥有逾30年经验。于1994年6月至1999年11月期间,彼先后在中国电力科学研究院电力系统研究所担任继电保护室主任及副所长;于1999年11月至2006年12月期间,彼在中国电力科学研究院输配电及节电 技术国家工程研究中心担任常务副主任;于2006年12月至2012年2月期间,彼在中国电力科学研究院担任副院长。邱先生于2012年2月至2020年2月期间,先后在全球能源互联网研究院有限公司(前称国网智能电网研究院)担任多个职位,包括副院长、院长、顾问及其他职位。邱先生现任厦门大学讲座教授,以及自2022年4月起担任博测锐创半导体科技(苏州)有限公司董事会主席兼总经理,自2022年5月起担任北京博测半导体科技有限公司执行董事兼总经理,自2023年6月起担任思源电气股份有限公司(一家于深圳证券交易所上市的公司(股票代码:002028))的独立董事,并自2023年9月起担任北京顺德盛企业管理合伙企业(有限合伙)的执行事务合伙人。
  • 李婉越女士

    李婉越女士,54岁,硕士学历,于2025年2月19日获委任为董事,并于同日获调整董事角色为非执行董事。
    李女士在会计及融资领域拥有30年经验。彼于1994年7月至1999年7月期间任职于北京新型建筑材料总厂,离职前为助理会计师。 于1999年10月至2020年12月期间,李女士先后在北新建材(集团)有限公司担任多个职位,包括财务部会计、财务部经理及其他职位。自2022年12月起,彼一直担任中建材联合投资有限公司的总会计师。
  • 方伟先生

    方伟先生,50岁,硕士学历,于2024年2月29日获委任为董事,并于2025年2月19日获重新委任为非执行董事。
    方先生在无线产品工程及企业管理领域拥有逾25年经验。自1999年2月起,彼任职于一家从事ICT(信息与通信)基础设施和智能终端提供商业务的全球性企业,现任第五轨道外派董事。自2023年12月起,彼亦担任苏州东微半导体股份有限公司(一家于上海证券交易所上市的公司(股票代码:688261))董事。
  • 李洪辉先生

    李洪辉先生,61岁,博士学历,于2024年2月29日获委任为独立董事,并于2025年2月19日获调整董事角色为独立非执行董事。
    李先生在财务管理领域拥有丰富的经验。彼任职于中华人民共和国财政部至2014年8月,最后职位为投资评审中心副主任。彼亦于2014年8月至2018年7月期间担任中国信达资产管理股份有限公司(一家于香港联交所上市的公司(股份代号:1359))董事。李先生于2018年担任中华人民共和国财政部预算评审中心副主任。彼亦担任中海外科技开发有限公司董事长至2019年11月。自2022年6月起至2024年1月期间,彼担任北京中财宝信管理咨询有限公司执行董事。李先生自2023年6月起,担任中润辉铭(海南)投资有限公司执行董事、总经理兼财务总监;自2023年10月起, 担任华大卓越(北京)投资管理有限公司(前称北京百家信诚投资管理有限公司)执行董事、总经理兼财务总监;自2024年8月起,担任吉林省北药科技有限公司总经理;并自2024年10月起,担任辽宁北药金吉科技发展有限公司监事。
  • 刘华女士

    刘华女士,56岁,本科学历,于2024年2月29日获委任为独立董事,并于2025年2月19日获调整董事角色为独立非执行董事。 刘女士在法律、监管及合规治理领域拥有丰富经验。彼于1992年7月至2002年3月期间在山东三联集团有限责任公司任职。于2002年7月至2007年2月及2007年2月至2008年7月,刘女士分别担任山东康桥律师事务所及北京天驰君泰律师事务所律师。于2008年8月至2019年10月期间,彼担任山东森信律师事务所合伙人及律师。自2019年11月起,刘女士担任北京天驰君泰(济南)律师事务所合伙人及律师。
  • 黎国鸿先生

    黎国鸿先生,61岁,硕士学历,于2025年2月19日获委任为独立董事,并于同日获调整董事角色为独立非执行董事。 黎先生在企业管治以及财务咨询及管理领域拥有丰富经验。彼于1989年7月至1996年8月期间前后在德勤·关黄陈方会计师行担任会计专员、高级会计师及经理。于1997年4月至2006年12月期间,黎先生就职于冠亚商业集团有限公司(一家于香港联交所上市的公司(股份代号:0104)),彼担任的最后职务为公司秘书兼财务总监。于2007年1月至2013年4月期间,黎先生在德祥地产集团有限公司(一家于香港联交所上市的公司(股份代号:0199))担任财务总监及在德祥企业集团有限公司(一家于香港联交所上市的公司(股份代号:0372))担任首席财务官兼公司秘书。自2013年8月起,黎先生在盛洋投资(控股)有限公司(一家于香港联交所上市的公司(股份代号:0174)) 担任执行董事及董事会投资委员会成员,并自2020年12月起兼任首席执行官。自2017年2月起,彼在桦欣控股有限公司(一家于香港联交所上市的公司(股份代号:1657))担任独立非执行董事。
监事
  • 张红岩女士

    张红岩女士,38岁,硕士学历,于2020年11月7日获委任为监事兼监事会主席。 张女士在技术工程领域拥有丰富经验。彼先后于2012年4月至2020年11月期间担任本公司前身山东太阳成集团tyc33455cc官网材料科技有限公司质量部技术员、技术中心主管、销售技术支持及质量部经理。自2020年11月起,彼担任本公司质量部负责人及监事。
  • 宋建先生

    宋建先生,38岁,于2020年11月7日获委任为监事。 宋先生在碳化硅研发领域拥有丰富经验。彼先后于2011年8月至2020年11月期间担任本公司前身山东太阳成集团tyc33455cc官网材料科技有限公司碳化硅事业部技术员及负责人、技术中心主管及设备动力部经理。自2020年11月起,彼担任本公司工程部负责人及监事。
  • 窦文涛先生

    窦文涛先生,42岁,于2024年8月22日获委任为监事。 窦先生在项目管理及企业管治领域拥有丰富经验。窦先生先后于2010年10月至2020年11月期间担任本公司前身山东太阳成集团tyc33455cc官网材料科技有限公司项目经理、销售部经理、执行董事(代)及董事长助理。自2020年11月起,彼担任本公司董事长助理。
高级管理人员
  • 宗艳民先生

    宗艳民先生,61岁,本科学历,为本公司的董事长、执行董事兼总经理,于2010年11月2日获委任为董事,并于2025年2月19日获调整董事角色为执行董事。 宗先生在半导体材料的技术研发与产业化、工程以及企业管理领域拥有逾35年经验。2010年11月,宗先生创立了本公司前身山东太阳成集团tyc33455cc官网材料科技有限公司,并于2010年11月至2020年11月期间历任董事会主席、执行董事及总经理。自2020年11月起,宗先生一直担任本公司董事长、董事兼总经理。
  • 高超先生

    高超先生,38岁,博士学历,为本公司执行董事兼首席技术官。彼于2019年8月15日获委任为董事,并于2025年2月19日获调整董事角色为执行董事。 高先生于半导体材料技术研发及产业化领域拥有逾十年经验。于2014年7月至2020年11月期间,彼先后在本公司前身山东太阳成集团tyc33455cc官网材料科技有限公司担任研发工程师、研发中心主任、董事兼研发中心主任。自2020年11月起,高先生一直担任本公司的董事兼首席技术官。
  • 钟文庆先生

    钟文庆先生,57岁,自2022年8月起担任本公司董事会秘书。钟先生于2018年12月加入本集团,并先后于2018年12月至2019年8月期间担任本公司首席财务官,于2019年8月至2023年4月期间担任董事兼首席财务官,并于2023年4月至2024年2月期间担任董事。钟先生目前还在本公司的若干子公司中担任董事及╱或监事职务。 钟先生在会计与财务管理、资本市场及企业管治领域拥有逾25年经验。在加入本集团之前,彼于1998年1月至1999年2月期间在通用磨坊(中国)投资有限公司的品食乐大中华区担任财务经理。在美国施乐中国有限公司工作期间,钟先生担任财务总监及市场总监。其后彼于2003年12月至2005年4月在西门子工业软件(上海)有限公司担任财务分析高级经理。钟先生于2005年6月加入沃尔沃建筑设备(中国)有限公司并担任沃尔沃建筑设备公司中国区首席财务官。钟先生于2011年1月至2018年11月期间担任瑞迈国际有限公司总裁。
  • 游樱女士

    游樱女士,50岁,自2024年9月起担任本公司首席财务官。游女士自2024年4月加入本集团起一直担任上海太阳成集团tyc33455cc的财务总监。 游女士在会计与财务管理领域拥有逾25年经验。在加入本集团之前,彼于1998年7月至2004年12月期间在山东干聚有限责任会计师事务所担任审计经理。游女士于2004年12月至2024年3月期间在上汽通用东岳汽车有限公司担任高级财务经理。
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Our mission

To achieve greater profits for shareholders
To provide better products and services for customers
To offer better development platform and benefits for employees
To create greater value and wealth for the society

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Product Consultation

You can contact us through the following ways, or put forward your requirements online

Contact:Sales Department

Tel:0531-85978212
Fax:0531-85978212
E-mail:sales@sicc.cc
Address:No.99 South Tianyue Road, Huaiyin District, Jinan, Shandong.
Online input

Investors

Contact:Board of Directors Office
Tel:0531-69900616
Fax:0531-85978212
E-mail:dmo@sicc.cc
Address:No.99 South Tianyue Road, Huaiyin District, Jinan, Shandong.
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The Semi-insulating SiC substrates have high resistivity and are mainly used for GaN heteroepitaxy.
The RF devices represented by HEMT combine the excellent thermal conductivity of SiC with the high-power Rf output of
GaN in high-frequency range, and are widely applied in the new generation communication field such as the 5G stations.
Semi-insulating Sic substrate materials also exhibit excellent optical properties.
The 12-inch substrates show promising application prospects in optical and wearable electronics, such as AR glasses.

*Please contact our sales for more detailed information.

>Contact us

Specifications

6-inch
  • Diameter 150.0mm+0mm/-0.2mm
  • Surface Orientation {0001}±0.2°
  • Primary Flat Orientation /
  • Secondary Flat Orientation /
  • Primary Flat Length Notch
  • Secondary Flat Length None
  • Notch Orientation <1100>±1.0°
  • Notch Depth None1mm+0.25mm/-0mm from edge
  • Notch Angle 90°+5°/-1°
  • Thickness 500.0um±25.0um
  • Type Semi-insulating

*Please contact our sales for more detailed information.

>Contact us

Specifications

8-inch
  • Diameter 200.0mm+0mm/-0.5mm
  • Surface Orientation {0001}±0.2°
  • Primary Flat Orientation /
  • Secondary Flat Orientation /
  • Primary Flat Length Notch
  • Secondary Flat Length None
  • Notch Orientation <1100>±1.0°
  • Notch Depth None1mm+0.25mm/-0mm from edge
  • Notch Angle 90°+5°/-1°
  • Thickness 500.0um±25.0um
  • Type Semi-insulating

*Please contact our sales for more detailed information.

>Contact us

Specifications

12-inch
  • Diameter 300.0mm+0mm/-0.5mm
  • Surface Orientation {0001}±0.5°
  • Primary Flat Orientation /
  • Secondary Flat Orientation /
  • Primary Flat Length Notch
  • Secondary Flat Length None
  • Notch Orientation <1100>±5.0°
  • Notch Depth None1mm+0.25mm/-0mm from edge
  • Notch Angle 90°+5°/-1°
  • Thickness 750.0um±25.0um
  • Type Semi-insulating

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Production Process of SiC Single Crystal

Silicon carbide single crystal is extremely rare in nature and can only be prepared by artificial synthesis. At present, the industrial production of silicon carbide substrate is mainly based on PVT method. This method needs to sublimate the powder with high temperature and vacuum, and then let the components grow on the seed surface through thermal field control, so as to obtain the silicon carbide crystals. The whole process is completed in an enclosed space, with few effective monitoring and many variables, which requires high process control accuracy.

SICC independently own the whole process from SiC powder to crystal growth and wafering.
1.

SiC Powder

Si+C=SiCPowder
Si and C are synthesized to SiC polycrystalline particles in the ratio of 1:1
SiC powder is the source of crystal growth, and its particle size and purity will directly affect the crystal quality
Especially in the preparation of semi-insulating substrate, the requirement of powder purity is very high
(Impurity content<0.5ppm)
2.

Seed

As the base of crystal growth, it provides the basic lattice structure for crystal growth
It is also the core raw material for crystal quality
3.

Crystal Growth

Physical Vapor Transport(PVT)
The raw materials are heated,
and the sublimated components recrystallize on the seed surface through vapor sublimation and thermal field control
4.

Slicing

SiC is a hard and brittle material whose hardness is second only to diamond
Therefore, it takes long time for slicing, and is easy to crack.
5.

Lapping•Polishing

MP·CMP
Lapping and polishing is to process the substrate surface to nano smooth mirror, which is Epi-ready
The surface state of substrate, such as surface roughness and thickness uniformity, will directly affect the quality of epitaxy and then affect the quality of devices.
6.

Cleaning • Inspection

To remove residual particles and metal impurities in the wafering processes
The final inspection can retain complete quality information such as substrate surface, surface flatness and crystal quality
It helps to trace for the downstream process
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Approaching SiC | The Principle of Silicon Carbide Crystal Growth

    In nature, crystals are everywhere, and their distribution and application are very extensive. Salt, sugar, diamond and snowflakes are all crystals that can be seen in daily life; Besides, crystal materials such as semiconductor crystal, laser crystal, scintillation crystal, and super-hard crystal also play an important role in industry, medical treatment, semiconductor, and many scientific research fields.

    Different crystals have different structures, properties and preparation methods. But their common feature is that the atoms in the crystal are regularly arranged, and the lattice with a specific structure is then formed through periodic stacking in three-dimensional space. Therefore, the appearance of crystal materials usually presents a regular geometric shape.

    Silicon Carbide Single Crystal Substrate Material (hereinafter referred to as SiC Substrate) is also a kind of crystalline materials. It belongs to wide bandgap semiconductor material, and has the advantages of high voltage resistance, high temperature resistance, high frequency, low loss, etc. It is a basic material for preparing high-power electronic devices and microwave RF devices.

The Crystal Structure of SiC

    SiC is a IV-IV compound semiconductor material composed of Carbon and Silicon in a stoichiometric ratio of 1:1, and its hardness is second only to diamond.

    Both Carbon and Silicon atoms have 4 valence electrons, which can form 4 covalent bonds. The basic structural unit of SiC crystal, SiC tetrahedron, arises out of the tetrahedral bonding between Silicon and Carbon atoms. The coordination number of both Silicon and Carbon atoms is 4, i.e. each Carbon atom has 4 Silicon atoms around it and each Silicon atom also has 4 Carbon atoms around it.

    As a crystal material, SiC Substrate also has the characteristic of periodic stacking of atomic layers. The Si-C diatomic layers are stacked along [0001] direction.Due to the small difference in bond energy between layers, different connection modes are easily generated between atomic layers, leading to over 200 SiC polytypes. Common polytypes include 2H-SiC, 3C-SiC, 4H-SiC, 6H-SiC, 15R-SiC, etc. Among them, the stacking sequence in the order of "ABCB" is called the 4H polytype. Although different polytypes of SiC have the same chemical composition, their physical properties, especially the bandgap width, carrier mobility and other characteristics are quite different. And the properties of 4H polytype are more suitable for semiconductor applications.

    The growth parameters such as temperature and pressure significantly influence the stability of 4H-SiC during growth process. Therefore, in order to obtain the single crystal material with high quality and uniformity, the parameters such as growth temperature, growth pressure and growth rate must be precisely controlled during the preparation.

Preparation Method of SiC: Physical Vapor Transport Method (PVT)

    At present, the preparation methods of Silicon Carbide are Physical Vapor Transport Method (PVT),High Temperature Chemical Vapor Deposition Method (HTCVD), and Liquid Phase Method (LPE). And PVT is a mainstream method that is suitable for industrial mass production.

    During PVT growth, SiC seed crystal is placed on the top of crucible while the source material (SiC powder) is placed in the bottom. In an enclosed environment with high temperature and low pressure, SiC powder sublimates, and then transports upward to the space near the seed under the effect of temperature gradient and concentration difference. And it will recrystallize after reaching the supersaturated state. Through this method, the size and polytype of SiC crystal can be controlled.

    However, the PVT method requires maintaining appropriate growth conditions throughout the entire growth process, otherwise it will lead to lattice disorder and form undesired defects. Besides, the SiC crystal growth is completed in an enclosed space with limited monitoring methods and many variables, thus the control of the process is difficult.

The Main Mechanism to Grow Single Crystal: Step Flow Growth

    In the process of growing SiC crystal by PVT method, step flow growth is considered as the main mechanism to form single crystals. The vaporized Si and C atoms will preferentially bond with the atoms on the crystal surface at steps and kinks, where they will nucleate and grow, so that each step flows forward in parallel. When the width between each step on the growth surface is far greater than the diffusion free path of the adsorbed atoms, a large number of adsorbed atoms may agglomerate, and form the two-dimensional island, which will destroy the step flow growth mode, resulting in the formation of other polytypes instead of 4H. Therefore, the adjustment of process parameters aims to control the step structure on the growth surface, so as to prevent the formation of undesired polytypes, and achieve the goal of obtaining 4H single crystal structure, and finally preparing high-quality crystals.

    The growth of the crystal is just the first step to prepare high quality SiC Substrate. Before being used, 4H-SiC ingot needs to go through a series of processes such as slicing, lapping, beveling, polishing, cleaning and inspecting. As a hard but brittle material, SiC single crystal also has high technical requirements for the wafering steps. Any damage generated in each process may have certain heredity, transfers to the next process and finally affect the product quality. Therefore, the efficient wafering technology for SiC Substrate also attracts the attention of the industry.

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P-type SiC substrate materials are mainly used for homoepitaxy and the fabrication of ultrahighvoltage powersemiconductor devices.
They are widely applied in smart grids represented by ultrahighvoltage power transmission,
as well as in rail transit and industrial highpower power supply fields.

*Please contact our sales for more detailed information.

>Contact us

Specifications

6-inch
  • Diameter 150.0mm+0mm/-0.2mm
  • Surface Orientation 4°toward<1120>±0.5°
  • Primary Flat Length 47.5mm±1.5mm
  • Primary Flat Orientation <1120>±5.0°
  • Notch Orientation /
  • Notch Angle /
  • Notch Depth /
  • Thickness 350.0um±25.0um
  • Polytype 4H
  • Type p-type

*Please contact our sales for more detailed information.

>Contact us

Specifications

8-inch
  • Diameter 200.0mm+0mm/-0.2mm
  • Surface Orientation 4°toward<1120>±0.5°
  • Primary Flat Length Notch
  • Primary Flat Orientation /
  • Notch Orientation <1100>±1.0°
  • Notch Angle 90°+5°/-1°
  • Notch Depth 1.0mm+0.25mm/-0mm
  • Thickness 350.0um±25.0um
  • Polytype 4H
  • Type p-type

*Please contact our sales for more detailed information.

>Contact us

Specifications

12-inch
  • Diameter 300.0mm±0.5mm
  • Surface Orientation 4°toward<1120>±0.5°
  • Primary Flat Length Notch
  • Primary Flat Orientation /
  • Notch Orientation <1100>±5.0°
  • Notch Angle 90°+5°/-1°
  • Notch Depth 1.0mm+0.25mm/-0mm
  • Thickness 750.0um±25.0um
  • Polytype 4H
  • Type p-type

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SiC represents silicon carbide substrate, and C is short for "company".
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Web content is being updated

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2025
Listed on the Main Board of the Hong Kong Stock Exchange
Global debut of a full product series of 12-inch SiC substrates
Awarded the International Gold Award for Semiconductors (Electronic Materials Category)
2024
World\'s First 12-Inch Silicon Carbide Substrate
Launched Liquid-Phase P-Type Silicon Carbide Substrates
2023
Product delivery started in Shanghai Plant
2022
IPO on the STAR Market (688234)
Successful development of 8-inch products
Awarded as a National Model Enterprise of Intellectual Property
2021
Named National Champion Enterprise of Manufacturing Industry
2020
First Prize of Shandong Provincial Science and Technology Progress
2019
The global market share of S.I. SiC substrate was over 15%
2018
Named the National IP Leading Company
2017
First Prize of Jinan Science and Technology Progress
2015
The new headquarter plant construction completed and operation started
2014
First Prize of Shandong Provincial Technology Invention
2010
Founded with the registered capital of 60 million RMB
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Product Consultation

You can contact us through the following ways, or put forward your requirements online

Contact:Sales Department

Tel:0531-85978212
Fax:0531-85978212
E-mail:sales@sicc.cc
Address:No.99 South Tianyue Road, Huaiyin District, Jinan, Shandong.
Online input

Investors

Contact:Board of Directors Office
Tel:0531-69900616
Fax:0531-85978212
E-mail:dmo@sicc.cc
Address:No.99 South Tianyue Road, Huaiyin District, Jinan, Shandong.
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)in Repository.php line 267
at Repository->forever('menuen', array(array('id' => 51, 'name' => 'About SICC', 'lan' => 'en', 'en_name' => 'about', 'path' => '', 'p_id' => 0, 'type' => 'article', 'flag' => 'article', 'status' => 'open', 'list_template' => 'about', 'detail_template' => 'about', 'cover_template' => '', 'detail_title' => '', 'thumbnail' => '/upload/image/v3bHtx6Hbcd2AkAGmUxbK3g9LknBk7zZrTDkWhEy.jpeg', 'summary' => 'About us', 'detail_content' => '', 'seo_title' => '', 'seo_keyword' => '', 'seo_description' => '', 'sort' => 0, 'listsize' => 11, 'created_at' => '1641639555', 'updated_at' => '1641652596', 'background_image' => '/upload/image/lviNyPW1twAt5a1kUEqPE3ft8npVCm1BrgBoiajW.png', 'href' => '/en/about.html', 'title' => 'About SICC'), array('id' => 58, 'name' => 'About us', 'lan' => 'en', 'en_name' => 'about1', 'path' => ',51,', 'p_id' => 51, 'type' => 'article', 'flag' => 'article', 'status' => 'open', 'list_template' => 'about1', 'detail_template' => 'about1', 'cover_template' => '', 'detail_title' => '', 'thumbnail' => '/upload/image/dd9xFIkjSnsZrxYTOwHbq1IRFpkwTVnzF7J6VlDv.jpeg', 'summary' => 'About SICC', 'detail_content' => '


SICC was founded in 2010. It is a technologicalcompany focusing on the R&D, production and sales of silicon carbide (SiC)substrate material.

With the business philosophy of Technology ·Quality · Sustainability, SICC attaches importance to product and servicequality, takes meeting customer needs and helping customers solve problems asits work orientation. SICC actively expands the market and pursues sustainablebusiness development while mastering the process technology independently.

The SiC Single Crystal Substrate is a widebandgap semiconductor material. Compared with traditional materials, it hasbetter physical properties and can effectively improve the power density andoverall performance of devices. It can be widely used in fields of powerelectronics and microwave electronics.

But what behind the superior physicalproperties are sophisticated and complex preparation processes. The SiC signalcrystal grows in an enclosed environment with high temperature and low pressure.Any slight change in the environment may cause lattice disorder, which willaffect the crystal quality.

Relying on the experience of industrialization andthe R&D team, SICC keeps paying attention to technology leading and qualityimproving, and insists on continuous innovation. SICC will build integratedsolutions to improve service and product, and strives to become aninternational famous company of semiconductor materials.

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Product consultation

Contact: Sales Department
Tel: 0531-85978212
Fax: 0531-85978212
Email: sales@sicc.cc
Address: No. 99, Tianyue South Road, Huaiyin District, Jinan City, Shandong Province

Investor Relations

Contact: Office of the Board of Directors
Tel: 0531-69900616
Fax: 0531-85978212
Email: dmo@sicc.cc
Address: No. 99, Tianyue South Road, Huaiyin District, Jinan City, Shandong Province

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N-type SiC substrate materials are primarily used for homoepitaxial growth in the fabrication of power semiconductor devices.
They are widely applied in new energy sectors such as electric vehicles, as well as in photovoltaic and wind power generation.
Currently, SICC\'s 6-inch and 8-inch products are consistently delivered to global customers for volume production, while also
possessing the capability to produce 12-inchsubstrate products.

*Please contact our sales for more detailed information.

>Contact us

Specifications

6-inch
  • Diameter 150.0mm+0mm/-0.2mm
  • Surface Orientation 4°toward<1120>±0.5°
  • Primary Flat Length 47.5 mm ±1.5 mm
  • Primary Flat Orientation <1120>±1.0°
  • Notch Orientation /
  • Notch Angle /
  • Notch Depth /
  • Secondary Flat N/A
  • Thickness 350.0um士25.0um
  • Polytype 4H
  • Type n-type

*Please contact our sales for more detailed information.

>Contact us

Specifications

8-inch
  • Diameter 200.0mm+0mm/-0.5mm
  • Surface Orientation 4°toward<1120>±0.5°
  • Primary Flat Length Notch
  • Primary Flat Orientation /
  • Notch Orientation <1100>±1.0°
  • Notch Angle 90°+5°/-1°
  • Notch Depth 1.0mm+0.25mm/-0mm
  • Secondary Flat N/A
  • Thickness 500.0um士25.0um
  • Polytype 4H
  • Type n-type

*Please contact our sales for more detailed information.

>Contact us

Specifications

12-inch
  • Diameter 300.0mm+0mm/-0.5mm
  • Surface Orientation 4°toward<1120>±0.5°
  • Primary Flat Length Notch
  • Primary Flat Orientation /
  • Notch Orientation <1100>±5.0°
  • Notch Angle 90°+5°/-1°
  • Notch Depth 1.0mm+0.25mm/-0mm
  • Secondary Flat N/A
  • Thickness 750.0um士25.0um
  • Polytype 4H
  • Type n-type

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What is Silicon Carbide

Compared with traditional materials, silicon carbide has excellent physical properties,
which can reduce weight and improve efficiency for discrete devices, modules and even systems

SiC

Si(silicon)+C(carbon)=SiC
Silicon carbide is a group IV - IV compound semiconductor material formed by C and Si elements in the ratio of 1:1,
and its hardness is second only to diamond.
This semiconductor material has great development potential, but is hard and brittle.
The preparation process is complex and the processing is difficult.

SiC Features

Excellent physical properties
Wide bandgap (High temperature resistance)1
High critical breakdown field(High voltage resistance2
High thermal conductivity(Heat dissipation)3
Saturated electron drift velocity(High switching speed)4
4H-SiC Si GaAs GaN
Wide bandgap(eV)1 3.26 1.12 1.42 3.42
High critical breakdown field(MV/cm)2 2.8 0.3 0.4 3
High thermal conductivity(W/cmK)3 4.9 1.5 0.46 1.3
Saturated electron drift velocity(1E7 cm/s)4 2.7 1 2 2.7
1.A wider bandgap can ensure that electrons are not easy to transit and intrinsic excitation is weak at high temperature. Thus, it can withstand higher operating temperature.
The bandgap width of silicon carbide is three times that of silicon, and its theoretical working temperature can reach more than 400 ℃.

2.Critical breakdown field strength refers to the electric field strength in electric breakdown. Once this value is exceeded, the material will lose its insulation performance.
It determines the voltage resistance of a material.
The critical field strength of silicon carbide is about 10 times that of Si, which can withstand higher voltage and is more suitable for high voltage devices.

3.Heat is one of the main reasons affecting the lifetime of devices.
The thermal conductivity represents the material\'s ability to conduct heat.
The high thermal conductivity of silicon carbide can effectively conduct heat, reduce the device temperature and maintain its normal operation. 

4.The saturated electron drift velocity refers to the maximum directional moving speed of electrons in semiconductor materials.
It determines the switching frequency of devices.
The saturated electron drift velocity of silicon carbide is twice that of silicon, which can miniaturize the device and improve efficiency.

SiC Applications

Power Electronics Devices

SiC power devices have unique advantages such as high voltage, high current, high temperature, high frequency and low loss, which will greatly improve the energy conversion efficiency of existing silicon based power devices and have a significant and far-reaching impact on the field of efficient energy conversion.
The main application fields are electric vehicles, charging piles, photovoltaic new energy, rail transit, smart grid, etc.

Microwave Communication

Silicon carbide based gallium nitride RF devices have been successfully applied in many fields, mainly in wireless communication infrastructure.
Silicon carbide as substrate gallium nitride RF devices have both good thermal conductivity of silicon carbide and advantages of high-power RF output of gallium nitride in high frequency band, which can provide the power and efficiency required by the next generation of high frequency telecommunication network and become the mainstream choice of 5G base station power amplifier.
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Directors, Supervisors and Senior Management
董事
  • 宗艳民先生

    宗艳民先生,61岁,本科学历,为本公司的董事长、执行董事兼总经理,于2010年11月2日获委任为董事,并于2025年2月19日获调整董事角色为执行董事。
    宗先生在半导体材料的技术研发与产业化、工程以及企业管理领域拥有逾35年经验。2010年11月,宗先生创立了本公司前身山东太阳成集团tyc33455cc官网材料科技有限公司,并于2010年11月至2020年11月期间历任董事会主席、执行董事及总经理。自2020年11月起,宗先生一直担任本公司董事长、董事兼总经理。
  • 高超先生

    高超先生,38岁,博士学历,为本公司执行董事兼首席技术官。彼于2019年8月15日获委任为董事,并于2025年2月19日获调整董事角色为执行董事。
    高先生于半导体材料技术研发及产业化领域拥有逾十年经验。于2014年7月至2020年11月期间,彼先后在本公司前身山东太阳成集团tyc33455cc官网材料科技有限公司担任研发工程师、研发中心主任、董事兼研发中心主任。自2020年11月起,高先生一直担任本公司的董事兼首席技术官。
  • 王俊国先生

    王俊国先生,47岁,于2025年7月2日获委任为董事,并于同日获调整董事角色为执行董事。
    王先生在财务管理领域拥有丰富经验。彼于2016年8月至2020年11月期间担任本公司前身山东太阳成集团tyc33455cc官网材料科技有限公司财务总监,并自2020年11月起担任本公司财务总监,并自2024年8月起担任我们的证券事务代表。
  • 邱宇峰先生

    邱宇峰先生,65岁,硕士学历,于2024年2月29日获委任为董事,并于2025年2月19日获调整董事角色为非执行董事。邱先生于2020年11月至2021年1月期间担任本公司独立董事。
    邱先生在电力及半导体技术研发领域拥有逾30年经验。于1994年6月至1999年11月期间,彼先后在中国电力科学研究院电力系统研究所担任继电保护室主任及副所长;于1999年11月至2006年12月期间,彼在中国电力科学研究院输配电及节电 技术国家工程研究中心担任常务副主任;于2006年12月至2012年2月期间,彼在中国电力科学研究院担任副院长。邱先生于2012年2月至2020年2月期间,先后在全球能源互联网研究院有限公司(前称国网智能电网研究院)担任多个职位,包括副院长、院长、顾问及其他职位。邱先生现任厦门大学讲座教授,以及自2022年4月起担任博测锐创半导体科技(苏州)有限公司董事会主席兼总经理,自2022年5月起担任北京博测半导体科技有限公司执行董事兼总经理,自2023年6月起担任思源电气股份有限公司(一家于深圳证券交易所上市的公司(股票代码:002028))的独立董事,并自2023年9月起担任北京顺德盛企业管理合伙企业(有限合伙)的执行事务合伙人。
  • 李婉越女士

    李婉越女士,54岁,硕士学历,于2025年2月19日获委任为董事,并于同日获调整董事角色为非执行董事。
    李女士在会计及融资领域拥有30年经验。彼于1994年7月至1999年7月期间任职于北京新型建筑材料总厂,离职前为助理会计师。 于1999年10月至2020年12月期间,李女士先后在北新建材(集团)有限公司担任多个职位,包括财务部会计、财务部经理及其他职位。自2022年12月起,彼一直担任中建材联合投资有限公司的总会计师。
  • 方伟先生

    方伟先生,50岁,硕士学历,于2024年2月29日获委任为董事,并于2025年2月19日获重新委任为非执行董事。
    方先生在无线产品工程及企业管理领域拥有逾25年经验。自1999年2月起,彼任职于一家从事ICT(信息与通信)基础设施和智能终端提供商业务的全球性企业,现任第五轨道外派董事。自2023年12月起,彼亦担任苏州东微半导体股份有限公司(一家于上海证券交易所上市的公司(股票代码:688261))董事。
  • 李洪辉先生

    李洪辉先生,61岁,博士学历,于2024年2月29日获委任为独立董事,并于2025年2月19日获调整董事角色为独立非执行董事。
    李先生在财务管理领域拥有丰富的经验。彼任职于中华人民共和国财政部至2014年8月,最后职位为投资评审中心副主任。彼亦于2014年8月至2018年7月期间担任中国信达资产管理股份有限公司(一家于香港联交所上市的公司(股份代号:1359))董事。李先生于2018年担任中华人民共和国财政部预算评审中心副主任。彼亦担任中海外科技开发有限公司董事长至2019年11月。自2022年6月起至2024年1月期间,彼担任北京中财宝信管理咨询有限公司执行董事。李先生自2023年6月起,担任中润辉铭(海南)投资有限公司执行董事、总经理兼财务总监;自2023年10月起, 担任华大卓越(北京)投资管理有限公司(前称北京百家信诚投资管理有限公司)执行董事、总经理兼财务总监;自2024年8月起,担任吉林省北药科技有限公司总经理;并自2024年10月起,担任辽宁北药金吉科技发展有限公司监事。
  • 刘华女士

    刘华女士,56岁,本科学历,于2024年2月29日获委任为独立董事,并于2025年2月19日获调整董事角色为独立非执行董事。 刘女士在法律、监管及合规治理领域拥有丰富经验。彼于1992年7月至2002年3月期间在山东三联集团有限责任公司任职。于2002年7月至2007年2月及2007年2月至2008年7月,刘女士分别担任山东康桥律师事务所及北京天驰君泰律师事务所律师。于2008年8月至2019年10月期间,彼担任山东森信律师事务所合伙人及律师。自2019年11月起,刘女士担任北京天驰君泰(济南)律师事务所合伙人及律师。
  • 黎国鸿先生

    黎国鸿先生,61岁,硕士学历,于2025年2月19日获委任为独立董事,并于同日获调整董事角色为独立非执行董事。 黎先生在企业管治以及财务咨询及管理领域拥有丰富经验。彼于1989年7月至1996年8月期间前后在德勤·关黄陈方会计师行担任会计专员、高级会计师及经理。于1997年4月至2006年12月期间,黎先生就职于冠亚商业集团有限公司(一家于香港联交所上市的公司(股份代号:0104)),彼担任的最后职务为公司秘书兼财务总监。于2007年1月至2013年4月期间,黎先生在德祥地产集团有限公司(一家于香港联交所上市的公司(股份代号:0199))担任财务总监及在德祥企业集团有限公司(一家于香港联交所上市的公司(股份代号:0372))担任首席财务官兼公司秘书。自2013年8月起,黎先生在盛洋投资(控股)有限公司(一家于香港联交所上市的公司(股份代号:0174)) 担任执行董事及董事会投资委员会成员,并自2020年12月起兼任首席执行官。自2017年2月起,彼在桦欣控股有限公司(一家于香港联交所上市的公司(股份代号:1657))担任独立非执行董事。
监事
  • 张红岩女士

    张红岩女士,38岁,硕士学历,于2020年11月7日获委任为监事兼监事会主席。 张女士在技术工程领域拥有丰富经验。彼先后于2012年4月至2020年11月期间担任本公司前身山东太阳成集团tyc33455cc官网材料科技有限公司质量部技术员、技术中心主管、销售技术支持及质量部经理。自2020年11月起,彼担任本公司质量部负责人及监事。
  • 宋建先生

    宋建先生,38岁,于2020年11月7日获委任为监事。 宋先生在碳化硅研发领域拥有丰富经验。彼先后于2011年8月至2020年11月期间担任本公司前身山东太阳成集团tyc33455cc官网材料科技有限公司碳化硅事业部技术员及负责人、技术中心主管及设备动力部经理。自2020年11月起,彼担任本公司工程部负责人及监事。
  • 窦文涛先生

    窦文涛先生,42岁,于2024年8月22日获委任为监事。 窦先生在项目管理及企业管治领域拥有丰富经验。窦先生先后于2010年10月至2020年11月期间担任本公司前身山东太阳成集团tyc33455cc官网材料科技有限公司项目经理、销售部经理、执行董事(代)及董事长助理。自2020年11月起,彼担任本公司董事长助理。
高级管理人员
  • 宗艳民先生

    宗艳民先生,61岁,本科学历,为本公司的董事长、执行董事兼总经理,于2010年11月2日获委任为董事,并于2025年2月19日获调整董事角色为执行董事。 宗先生在半导体材料的技术研发与产业化、工程以及企业管理领域拥有逾35年经验。2010年11月,宗先生创立了本公司前身山东太阳成集团tyc33455cc官网材料科技有限公司,并于2010年11月至2020年11月期间历任董事会主席、执行董事及总经理。自2020年11月起,宗先生一直担任本公司董事长、董事兼总经理。
  • 高超先生

    高超先生,38岁,博士学历,为本公司执行董事兼首席技术官。彼于2019年8月15日获委任为董事,并于2025年2月19日获调整董事角色为执行董事。 高先生于半导体材料技术研发及产业化领域拥有逾十年经验。于2014年7月至2020年11月期间,彼先后在本公司前身山东太阳成集团tyc33455cc官网材料科技有限公司担任研发工程师、研发中心主任、董事兼研发中心主任。自2020年11月起,高先生一直担任本公司的董事兼首席技术官。
  • 钟文庆先生

    钟文庆先生,57岁,自2022年8月起担任本公司董事会秘书。钟先生于2018年12月加入本集团,并先后于2018年12月至2019年8月期间担任本公司首席财务官,于2019年8月至2023年4月期间担任董事兼首席财务官,并于2023年4月至2024年2月期间担任董事。钟先生目前还在本公司的若干子公司中担任董事及╱或监事职务。 钟先生在会计与财务管理、资本市场及企业管治领域拥有逾25年经验。在加入本集团之前,彼于1998年1月至1999年2月期间在通用磨坊(中国)投资有限公司的品食乐大中华区担任财务经理。在美国施乐中国有限公司工作期间,钟先生担任财务总监及市场总监。其后彼于2003年12月至2005年4月在西门子工业软件(上海)有限公司担任财务分析高级经理。钟先生于2005年6月加入沃尔沃建筑设备(中国)有限公司并担任沃尔沃建筑设备公司中国区首席财务官。钟先生于2011年1月至2018年11月期间担任瑞迈国际有限公司总裁。
  • 游樱女士

    游樱女士,50岁,自2024年9月起担任本公司首席财务官。游女士自2024年4月加入本集团起一直担任上海太阳成集团tyc33455cc的财务总监。 游女士在会计与财务管理领域拥有逾25年经验。在加入本集团之前,彼于1998年7月至2004年12月期间在山东干聚有限责任会计师事务所担任审计经理。游女士于2004年12月至2024年3月期间在上汽通用东岳汽车有限公司担任高级财务经理。
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Our mission

To achieve greater profits for shareholders
To provide better products and services for customers
To offer better development platform and benefits for employees
To create greater value and wealth for the society

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Product Consultation

You can contact us through the following ways, or put forward your requirements online

Contact:Sales Department

Tel:0531-85978212
Fax:0531-85978212
E-mail:sales@sicc.cc
Address:No.99 South Tianyue Road, Huaiyin District, Jinan, Shandong.
Online input

Investors

Contact:Board of Directors Office
Tel:0531-69900616
Fax:0531-85978212
E-mail:dmo@sicc.cc
Address:No.99 South Tianyue Road, Huaiyin District, Jinan, Shandong.
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The Semi-insulating SiC substrates have high resistivity and are mainly used for GaN heteroepitaxy.
The RF devices represented by HEMT combine the excellent thermal conductivity of SiC with the high-power Rf output of
GaN in high-frequency range, and are widely applied in the new generation communication field such as the 5G stations.
Semi-insulating Sic substrate materials also exhibit excellent optical properties.
The 12-inch substrates show promising application prospects in optical and wearable electronics, such as AR glasses.

*Please contact our sales for more detailed information.

>Contact us

Specifications

6-inch
  • Diameter 150.0mm+0mm/-0.2mm
  • Surface Orientation {0001}±0.2°
  • Primary Flat Orientation /
  • Secondary Flat Orientation /
  • Primary Flat Length Notch
  • Secondary Flat Length None
  • Notch Orientation <1100>±1.0°
  • Notch Depth None1mm+0.25mm/-0mm from edge
  • Notch Angle 90°+5°/-1°
  • Thickness 500.0um±25.0um
  • Type Semi-insulating

*Please contact our sales for more detailed information.

>Contact us

Specifications

8-inch
  • Diameter 200.0mm+0mm/-0.5mm
  • Surface Orientation {0001}±0.2°
  • Primary Flat Orientation /
  • Secondary Flat Orientation /
  • Primary Flat Length Notch
  • Secondary Flat Length None
  • Notch Orientation <1100>±1.0°
  • Notch Depth None1mm+0.25mm/-0mm from edge
  • Notch Angle 90°+5°/-1°
  • Thickness 500.0um±25.0um
  • Type Semi-insulating

*Please contact our sales for more detailed information.

>Contact us

Specifications

12-inch
  • Diameter 300.0mm+0mm/-0.5mm
  • Surface Orientation {0001}±0.5°
  • Primary Flat Orientation /
  • Secondary Flat Orientation /
  • Primary Flat Length Notch
  • Secondary Flat Length None
  • Notch Orientation <1100>±5.0°
  • Notch Depth None1mm+0.25mm/-0mm from edge
  • Notch Angle 90°+5°/-1°
  • Thickness 750.0um±25.0um
  • Type Semi-insulating

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Production Process of SiC Single Crystal

Silicon carbide single crystal is extremely rare in nature and can only be prepared by artificial synthesis. At present, the industrial production of silicon carbide substrate is mainly based on PVT method. This method needs to sublimate the powder with high temperature and vacuum, and then let the components grow on the seed surface through thermal field control, so as to obtain the silicon carbide crystals. The whole process is completed in an enclosed space, with few effective monitoring and many variables, which requires high process control accuracy.

SICC independently own the whole process from SiC powder to crystal growth and wafering.
1.

SiC Powder

Si+C=SiCPowder
Si and C are synthesized to SiC polycrystalline particles in the ratio of 1:1
SiC powder is the source of crystal growth, and its particle size and purity will directly affect the crystal quality
Especially in the preparation of semi-insulating substrate, the requirement of powder purity is very high
(Impurity content<0.5ppm)
2.

Seed

As the base of crystal growth, it provides the basic lattice structure for crystal growth
It is also the core raw material for crystal quality
3.

Crystal Growth

Physical Vapor Transport(PVT)
The raw materials are heated,
and the sublimated components recrystallize on the seed surface through vapor sublimation and thermal field control
4.

Slicing

SiC is a hard and brittle material whose hardness is second only to diamond
Therefore, it takes long time for slicing, and is easy to crack.
5.

Lapping•Polishing

MP·CMP
Lapping and polishing is to process the substrate surface to nano smooth mirror, which is Epi-ready
The surface state of substrate, such as surface roughness and thickness uniformity, will directly affect the quality of epitaxy and then affect the quality of devices.
6.

Cleaning • Inspection

To remove residual particles and metal impurities in the wafering processes
The final inspection can retain complete quality information such as substrate surface, surface flatness and crystal quality
It helps to trace for the downstream process
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Approaching SiC | The Principle of Silicon Carbide Crystal Growth

    In nature, crystals are everywhere, and their distribution and application are very extensive. Salt, sugar, diamond and snowflakes are all crystals that can be seen in daily life; Besides, crystal materials such as semiconductor crystal, laser crystal, scintillation crystal, and super-hard crystal also play an important role in industry, medical treatment, semiconductor, and many scientific research fields.

    Different crystals have different structures, properties and preparation methods. But their common feature is that the atoms in the crystal are regularly arranged, and the lattice with a specific structure is then formed through periodic stacking in three-dimensional space. Therefore, the appearance of crystal materials usually presents a regular geometric shape.

    Silicon Carbide Single Crystal Substrate Material (hereinafter referred to as SiC Substrate) is also a kind of crystalline materials. It belongs to wide bandgap semiconductor material, and has the advantages of high voltage resistance, high temperature resistance, high frequency, low loss, etc. It is a basic material for preparing high-power electronic devices and microwave RF devices.

The Crystal Structure of SiC

    SiC is a IV-IV compound semiconductor material composed of Carbon and Silicon in a stoichiometric ratio of 1:1, and its hardness is second only to diamond.

    Both Carbon and Silicon atoms have 4 valence electrons, which can form 4 covalent bonds. The basic structural unit of SiC crystal, SiC tetrahedron, arises out of the tetrahedral bonding between Silicon and Carbon atoms. The coordination number of both Silicon and Carbon atoms is 4, i.e. each Carbon atom has 4 Silicon atoms around it and each Silicon atom also has 4 Carbon atoms around it.

    As a crystal material, SiC Substrate also has the characteristic of periodic stacking of atomic layers. The Si-C diatomic layers are stacked along [0001] direction.Due to the small difference in bond energy between layers, different connection modes are easily generated between atomic layers, leading to over 200 SiC polytypes. Common polytypes include 2H-SiC, 3C-SiC, 4H-SiC, 6H-SiC, 15R-SiC, etc. Among them, the stacking sequence in the order of "ABCB" is called the 4H polytype. Although different polytypes of SiC have the same chemical composition, their physical properties, especially the bandgap width, carrier mobility and other characteristics are quite different. And the properties of 4H polytype are more suitable for semiconductor applications.

    The growth parameters such as temperature and pressure significantly influence the stability of 4H-SiC during growth process. Therefore, in order to obtain the single crystal material with high quality and uniformity, the parameters such as growth temperature, growth pressure and growth rate must be precisely controlled during the preparation.

Preparation Method of SiC: Physical Vapor Transport Method (PVT)

    At present, the preparation methods of Silicon Carbide are Physical Vapor Transport Method (PVT),High Temperature Chemical Vapor Deposition Method (HTCVD), and Liquid Phase Method (LPE). And PVT is a mainstream method that is suitable for industrial mass production.

    During PVT growth, SiC seed crystal is placed on the top of crucible while the source material (SiC powder) is placed in the bottom. In an enclosed environment with high temperature and low pressure, SiC powder sublimates, and then transports upward to the space near the seed under the effect of temperature gradient and concentration difference. And it will recrystallize after reaching the supersaturated state. Through this method, the size and polytype of SiC crystal can be controlled.

    However, the PVT method requires maintaining appropriate growth conditions throughout the entire growth process, otherwise it will lead to lattice disorder and form undesired defects. Besides, the SiC crystal growth is completed in an enclosed space with limited monitoring methods and many variables, thus the control of the process is difficult.

The Main Mechanism to Grow Single Crystal: Step Flow Growth

    In the process of growing SiC crystal by PVT method, step flow growth is considered as the main mechanism to form single crystals. The vaporized Si and C atoms will preferentially bond with the atoms on the crystal surface at steps and kinks, where they will nucleate and grow, so that each step flows forward in parallel. When the width between each step on the growth surface is far greater than the diffusion free path of the adsorbed atoms, a large number of adsorbed atoms may agglomerate, and form the two-dimensional island, which will destroy the step flow growth mode, resulting in the formation of other polytypes instead of 4H. Therefore, the adjustment of process parameters aims to control the step structure on the growth surface, so as to prevent the formation of undesired polytypes, and achieve the goal of obtaining 4H single crystal structure, and finally preparing high-quality crystals.

    The growth of the crystal is just the first step to prepare high quality SiC Substrate. Before being used, 4H-SiC ingot needs to go through a series of processes such as slicing, lapping, beveling, polishing, cleaning and inspecting. As a hard but brittle material, SiC single crystal also has high technical requirements for the wafering steps. Any damage generated in each process may have certain heredity, transfers to the next process and finally affect the product quality. Therefore, the efficient wafering technology for SiC Substrate also attracts the attention of the industry.

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P-type SiC substrate materials are mainly used for homoepitaxy and the fabrication of ultrahighvoltage powersemiconductor devices.
They are widely applied in smart grids represented by ultrahighvoltage power transmission,
as well as in rail transit and industrial highpower power supply fields.

*Please contact our sales for more detailed information.

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Specifications

6-inch
  • Diameter 150.0mm+0mm/-0.2mm
  • Surface Orientation 4°toward<1120>±0.5°
  • Primary Flat Length 47.5mm±1.5mm
  • Primary Flat Orientation <1120>±5.0°
  • Notch Orientation /
  • Notch Angle /
  • Notch Depth /
  • Thickness 350.0um±25.0um
  • Polytype 4H
  • Type p-type

*Please contact our sales for more detailed information.

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Specifications

8-inch
  • Diameter 200.0mm+0mm/-0.2mm
  • Surface Orientation 4°toward<1120>±0.5°
  • Primary Flat Length Notch
  • Primary Flat Orientation /
  • Notch Orientation <1100>±1.0°
  • Notch Angle 90°+5°/-1°
  • Notch Depth 1.0mm+0.25mm/-0mm
  • Thickness 350.0um±25.0um
  • Polytype 4H
  • Type p-type

*Please contact our sales for more detailed information.

>Contact us

Specifications

12-inch
  • Diameter 300.0mm±0.5mm
  • Surface Orientation 4°toward<1120>±0.5°
  • Primary Flat Length Notch
  • Primary Flat Orientation /
  • Notch Orientation <1100>±5.0°
  • Notch Angle 90°+5°/-1°
  • Notch Depth 1.0mm+0.25mm/-0mm
  • Thickness 750.0um±25.0um
  • Polytype 4H
  • Type p-type

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Web content is being updated

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2025
Listed on the Main Board of the Hong Kong Stock Exchange
Global debut of a full product series of 12-inch SiC substrates
Awarded the International Gold Award for Semiconductors (Electronic Materials Category)
2024
World\'s First 12-Inch Silicon Carbide Substrate
Launched Liquid-Phase P-Type Silicon Carbide Substrates
2023
Product delivery started in Shanghai Plant
2022
IPO on the STAR Market (688234)
Successful development of 8-inch products
Awarded as a National Model Enterprise of Intellectual Property
2021
Named National Champion Enterprise of Manufacturing Industry
2020
First Prize of Shandong Provincial Science and Technology Progress
2019
The global market share of S.I. SiC substrate was over 15%
2018
Named the National IP Leading Company
2017
First Prize of Jinan Science and Technology Progress
2015
The new headquarter plant construction completed and operation started
2014
First Prize of Shandong Provincial Technology Invention
2010
Founded with the registered capital of 60 million RMB
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Product Consultation

You can contact us through the following ways, or put forward your requirements online

Contact:Sales Department

Tel:0531-85978212
Fax:0531-85978212
E-mail:sales@sicc.cc
Address:No.99 South Tianyue Road, Huaiyin District, Jinan, Shandong.
Online input

Investors

Contact:Board of Directors Office
Tel:0531-69900616
Fax:0531-85978212
E-mail:dmo@sicc.cc
Address:No.99 South Tianyue Road, Huaiyin District, Jinan, Shandong.
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at CacheManager->__call('rememberForever', array('menuen', object(Closure)))in Facade.php line 221
at Facade::__callStatic('rememberForever', array('menuen', object(Closure)))in Menu.php line 154
at Menu->getLanMenuInfo('en', '')in Menu.php line 297
at Menu->getMenuEnnameInfoMap('en')in IndexController.php line 445
at IndexController->menu('dzgg', array('page' => '294'), 'en')in Handler.php line 62
at Handler->render(object(Request), object(NotFoundHttpException))in Pipeline.php line 82
at Pipeline->handleException(object(Request), object(NotFoundHttpException))in Pipeline.php line 32
at Pipeline->Illuminate\Routing\{closure}(object(Request))in TransformsRequest.php line 30
at TransformsRequest->handle(object(Request), object(Closure))in Pipeline.php line 148
at Pipeline->Illuminate\Pipeline\{closure}(object(Request))in Pipeline.php line 53
at Pipeline->Illuminate\Routing\{closure}(object(Request))in ValidatePostSize.php line 27
at ValidatePostSize->handle(object(Request), object(Closure))in Pipeline.php line 148
at Pipeline->Illuminate\Pipeline\{closure}(object(Request))in Pipeline.php line 53
at Pipeline->Illuminate\Routing\{closure}(object(Request))in CheckForMaintenanceMode.php line 46
at CheckForMaintenanceMode->handle(object(Request), object(Closure))in Pipeline.php line 148
at Pipeline->Illuminate\Pipeline\{closure}(object(Request))in Pipeline.php line 53
at Pipeline->Illuminate\Routing\{closure}(object(Request))in Pipeline.php line 102
at Pipeline->then(object(Closure))in Kernel.php line 151
at Kernel->sendRequestThroughRouter(object(Request))in Kernel.php line 116
at Kernel->handle(object(Request))in index.php line 53
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